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Category:Junhee Shin of Yongin-Si (KR)

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Junhee Shin

Junhee Shin from Yongin-Si (KR) has applied for patents in technology areas such as G01R31/317, G01R31/28, G01R31/30 with samsung electronics co., ltd..

Patents

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME (20250076377)

Pages in category "Junhee Shin of Yongin-Si (KR)"

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Samsung electronics co., ltd. (20250076377). BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME

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