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Category:G11C29/42
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Pages in category "G11C29/42"
The following 33 pages are in this category, out of 33 total.
1
- 17750581. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17807314. ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17808043. INTERRUPTING A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17815742. INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST USING A DATA MASK INVERSION BIT simplified abstract (Micron Technology, Inc.)
- 17822909. APPARATUSES, SYSTEMS, AND METHODS FOR MODULE LEVEL ERROR CORRECTION simplified abstract (Micron Technology, Inc.)
- 17822912. APPARATUSES, SYSTEMS, AND METHODS FOR MODULE LEVEL ERROR CORRECTION simplified abstract (Micron Technology, Inc.)
- 17830677. STORAGE DEVICE AND OPERATING METHOD OF STORAGE DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17942143. Mitigation of transistor reliability degradation within memory circuits simplified abstract (Apple Inc.)
- 17944135. BUILT-IN SELF-TEST CIRCUITRY simplified abstract (Micron Technology, Inc.)
- 17949867. TESTING OPERATIONS FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 18068337. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18093560. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18164100. MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CORRECTION CAPABILITY AND METHODS OF OPERATING SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18174186. SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18211472. TRANSMISSION FAILURE FEEDBACK SCHEMES FOR REDUCING CROSSTALK simplified abstract (Micron Technology, Inc.)
- 18302034. SEMICONDUCTOR MEMORY DEVICES THAT SUPPORT ENHANCED DATA RECOVERY OPERATIONS simplified abstract (Samsung Electronics Co., Ltd.)
- 18358587. MEMORY SYSTEM simplified abstract (SK hynix Inc.)
- 18455575. MEMORY SYSTEM HAVING A NON-VOLATILE MEMORY AND A CONTROLLER CONFIGURED TO SWITCH A MODE FOR CONTROLLING AN ACCESS OPERATION TO THE NON-VOLATILE MEMORY simplified abstract (Kioxia Corporation)
- 18455904. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18475968. BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODULE TESTING METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18521382. WEIGHTED WEAR LEVELING FOR IMPROVING UNIFORMITY simplified abstract (Micron Technology, Inc.)
- 18527978. NAND DATA PLACEMENT SCHEMA simplified abstract (Micron Technology, Inc.)