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Category:G11C29/02
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Pages in category "G11C29/02"
The following 31 pages are in this category, out of 31 total.
1
- 17821608. CALIBRATION OF THRESHOLD VOLTAGE SHIFT VALUES simplified abstract (International Business Machines Corporation)
- 17831329. GLITCH DETECTION REDUNDANCY simplified abstract (Micron Technology, Inc.)
- 17854638. METHOD OF ERROR CORRECTION CODE (ECC) DECODING AND MEMORY SYSTEM PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17862082. DIFFERENTIAL STROBE FAULT INDICATION simplified abstract (Micron Technology, Inc.)
- 17898725. BLOCK FAMILY ERROR AVOIDANCE BIN SCANS AFTER MEMORY DEVICE POWER-ON simplified abstract (Micron Technology, Inc.)
- 17944135. BUILT-IN SELF-TEST CIRCUITRY simplified abstract (Micron Technology, Inc.)
- 17954663. SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18080282. MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE simplified abstract (SK hynix Inc.)
- 18096407. SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract (SK hynix Inc.)
- 18132472. DATA STORAGE DEVICE FOR CHECKING A DEFECT OF ROW LINES AND AN OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18222563. MEMORY SYSTEM, OPERATING METHOD OF THE SAME, AND CONTROLLER OF MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18238096. TECHNOLOGIES FOR ALLOCATING RESOURCES ACROSS DATA CENTERS simplified abstract (Intel Corporation)
- 18361132. NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE DEVICE INCLUDING THE NONVOLATILE MEMORY simplified abstract (Samsung Electronics Co., Ltd.)
- 18364026. MEMORY DEVICE AND ZQ CALIBRATION METHOD simplified abstract (Changxin Memory Technologies, Inc.)
- 18392740. AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES simplified abstract (Texas Instruments Incorporated)
- 18493051. MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
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- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on January 18th, 2024
- MICRON TECHNOLOGY, INC. patent applications on January 25th, 2024
- Micron Technology, Inc. patent applications on March 14th, 2024
- Microsoft Technology Licensing, LLC patent applications on February 29th, 2024
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- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on February 29th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 18th, 2024
- Sk hynix inc. (20240120015). SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024