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Category:G11C29/50
Subcategories
This category has the following 25 subcategories, out of 25 total.
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Pages in category "G11C29/50"
The following 96 pages are in this category, out of 96 total.
1
- 17723959. STORAGE CONTROLLER DETERMINING ERROR COUNT, METHOD OF OPERATING THE SAME, AND METHOD OF OPERATING STORAGE DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17748441. SEMICONDUCTOR MEMORY DEVICE WITH DEFECT DETECTION CAPABILITY simplified abstract (Samsung Electronics Co., Ltd.)
- 17873869. VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME simplified abstract (Micron Technology, Inc.)
- 17873991. PERFORMING SENSE OPERATIONS IN MEMORY simplified abstract (Micron Technology, Inc.)
- 18069205. TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM simplified abstract (International Business Machines Corporation)
- 18113165. SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18161859. SEMICONDUCTOR CHIP AND SEQUENCE CHECKING CIRCUIT simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18166656. TEST DEVICES AND SYSTEMS THAT UTILIZE EFFICIENT TEST ALGORITHMS TO EVALUATE DEVICES UNDER TEST simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18172983. Method And System For Estimating And Compensating For Leakage Current In Memory Unit Cells simplified abstract (Meta Platforms Technologies, LLC)
- 18242884. PERFORMING SELECT GATE INTEGRITY CHECKS TO IDENTIFY AND INVALIDATE DEFECTIVE BLOCKS simplified abstract (MICRON TECHNOLOGY, INC.)
- 18315571. SEMICONDUCTOR MEMORY DEVICE AND MEMORY MODULE HAVING VARIOUS OPERATION MODES simplified abstract (Samsung Electronics Co., Ltd.)
- 18342517. SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY simplified abstract (SK hynix Inc.)
- 18374026. NON-VOLATILE MEMORY DEVICE, OPERATING METHOD THEREOF, CONTROLLER FOR CONTROLLING THE SAME, AND STORAGE DEVICE HAVING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18402647. METHOD AND MEMORY DEVICE WITH INCREASED READ AND WRITE MARGIN simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18409265. MEMORY DEVICE FOR PERFORMING BAD BLOCK CHECK, METHOD OF OPERATING MEMORY DEVICE, AND METHOD OF OPERATING STORAGE CONTROLLER COMMUNICATING WITH MEMORY DEVICE (SK hynix Inc.)
- 18423819. TRACKING CHARGE LOSS IN MEMORY SUB-SYSTEMS simplified abstract (Micron Technology, Inc.)
- 18429729. METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE simplified abstract (Texas Instruments Incorporated)
- 18431676. METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRATE FOR IMPROVED PERFORMANCE, AND ASSOCIATED SYSTEMS AND METHODS simplified abstract (Micron Technology, Inc.)
- 18442866. SEMICONDUCTOR DEVICES RELATED TO PRECHARGE OPERATION (SK hynix Inc.)
- 18443997. MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18493051. MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18586149. VARYING-POLARITY READ OPERATIONS FOR POLARITY-WRITTEN MEMORY CELLS simplified abstract (Micron Technology, Inc.)
- 18602782. VOLTAGE DOMAIN BASED ERROR MANAGEMENT simplified abstract (Micron Technology, Inc.)
- 18622190. READ PASS VOLTAGE ADJUSTMENT AMONG MULTIPLE ERASE BLOCKS COUPLED TO A SAME STRING simplified abstract (Micron Technology, Inc.)
- 18624904. NON-VOLATILE MEMORY (SAMSUNG ELECTRONICS CO., LTD.)
- 18647853. MEMORY DEVICE USING DATA STROBE SIGNAL AND METHOD FOR COMPENSATING SKEW OF DATA STROBE SIGNAL THEREOF (SAMSUNG ELECTRONICS CO., LTD.)
- 18658740. Memory Calibration and Margin Check simplified abstract (Apple Inc.)
- 18814460. TEST APPARATUS AND TEST METHOD (Kioxia Corporation)
- 18892864. MEMORY DEVICE, MEMORY SYSTEM INCLUDING THE MEMORY DEVICE, AND TEST OPERATION OF THE MEMORY DEVICE (SK hynix Inc.)
- 18958550. OPTIMIZING VOLTAGE TUNING USING PRIOR VOLTAGE TUNING RESULTS (PURE STORAGE, INC.)
- 18963358. MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18975645. SCAN-BASED VOLTAGE FREQUENCY SCALING (Micron Technology, Inc.)
- 18979331. READ WINDOW MANAGEMENT IN A MEMORY SYSTEM (Micron Technology, Inc.)
- 19002120. MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD OF OPERATING THE SAME (Samsung Electronics Co., Ltd.)
- 19005835. DETERMINE OPTIMIZED READ VOLTAGE VIA IDENTIFICATION OF DISTRIBUTION SHAPE OF SIGNAL AND NOISE CHARACTERISTICS (MICRON TECHNOLOGY, INC.)
- 19018469. MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD OF OPERATING THE SAME (Samsung Electronics Co., Ltd.)
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- Meta platforms technologies, llc (20240282398). Method And System For Estimating And Compensating For Leakage Current In Memory Unit Cells simplified abstract
- Meta Platforms Technologies, LLC patent applications on August 22nd, 2024
- Micron technology, inc. (20240177743). METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRATE FOR IMPROVED PERFORMANCE, AND ASSOCIATED SYSTEMS AND METHODS simplified abstract
- Micron technology, inc. (20240242774). TRACKING CHARGE LOSS IN MEMORY SUB-SYSTEMS simplified abstract
- Micron technology, inc. (20240312518). VARYING-POLARITY READ OPERATIONS FOR POLARITY-WRITTEN MEMORY CELLS simplified abstract
- Micron technology, inc. (20240321380). VOLTAGE DOMAIN BASED ERROR MANAGEMENT simplified abstract
- Micron technology, inc. (20250104794). SCAN-BASED VOLTAGE FREQUENCY SCALING
- Micron technology, inc. (20250111886). READ WINDOW MANAGEMENT IN A MEMORY SYSTEM
- Micron technology, inc. (20250131965). DETERMINE OPTIMIZED READ VOLTAGE VIA IDENTIFICATION OF DISTRIBUTION SHAPE OF SIGNAL AND NOISE CHARACTERISTICS
- MICRON TECHNOLOGY, INC. patent applications on April 24th, 2025
- Micron Technology, Inc. patent applications on April 3rd, 2025
- Micron Technology, Inc. patent applications on February 13th, 2025
- Micron Technology, Inc. patent applications on February 1st, 2024
- Micron Technology, Inc. patent applications on February 6th, 2025
- Micron Technology, Inc. patent applications on January 18th, 2024
- Micron Technology, Inc. patent applications on July 18th, 2024
- Micron Technology, Inc. patent applications on March 27th, 2025
- Micron Technology, Inc. patent applications on May 30th, 2024
- Micron Technology, Inc. patent applications on October 17th, 2024
- Micron Technology, Inc. patent applications on September 19th, 2024
- Micron Technology, Inc. patent applications on September 26th, 2024
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- Samsung electronics co., ltd. (20240096404). SEMICONDUCTOR MEMORY DEVICE AND MEMORY MODULE HAVING VARIOUS OPERATION MODES simplified abstract
- Samsung electronics co., ltd. (20240161860). SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD simplified abstract
- Samsung electronics co., ltd. (20240420794). NON-VOLATILE MEMORY
- Samsung electronics co., ltd. (20250022504). MEMORY DEVICE AND OPERATION METHOD THEREOF
- Samsung electronics co., ltd. (20250104751). MEMORY DEVICE USING DATA STROBE SIGNAL AND METHOD FOR COMPENSATING SKEW OF DATA STROBE SIGNAL THEREOF
- Samsung electronics co., ltd. (20250124959). MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD OF OPERATING THE SAME
- Samsung electronics co., ltd. (20250149076). MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD OF OPERATING THE SAME
- Samsung Electronics Co., Ltd. patent applications on April 17th, 2025
- Samsung Electronics Co., Ltd. patent applications on December 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on December 19th, 2024
- Samsung Electronics Co., Ltd. patent applications on February 29th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 16th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 25th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 21st, 2024
- Samsung Electronics Co., Ltd. patent applications on March 27th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 27th, 2025
- Samsung Electronics Co., Ltd. patent applications on May 16th, 2024
- Samsung Electronics Co., Ltd. patent applications on May 8th, 2025
- Sk hynix inc. (20240282350). SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY simplified abstract
- SK hynix Inc. patent applications on August 22nd, 2024
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- Taiwan semiconductor manufacturing co., ltd. (20240194234). MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME simplified abstract
- Taiwan semiconductor manufacturing co., ltd. (20250095762). MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on June 13th, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 20th, 2025
- Taiwan semiconductor manufacturing company, ltd. (20240136008). METHOD AND MEMORY DEVICE WITH INCREASED READ AND WRITE MARGIN simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on April 25th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on March 14th, 2024