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18342517. SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY simplified abstract (SK hynix Inc.)

From WikiPatents

SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY

Organization Name

SK hynix Inc.

Inventor(s)

Yun Suk Hong of Icheon-si Gyeonggi-do (KR)

SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY - A simplified explanation of the abstract

This abstract first appeared for US patent application 18342517 titled 'SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY

Simplified Explanation

The semiconductor device described in the patent application includes circuits that control the voltages of pull-up and pull-down sources during normal and test periods. An equalization control signal driver ensures voltage levels are equalized in a bit line sense amplifier.

Key Features and Innovation

  • Pull-up source voltage generation circuit drives pull-up voltage to normal voltage during normal period and to test voltage during test period.
  • Pull-down source voltage generation circuit drives pull-down voltage to ground voltage during normal period and to bit line pre-charge voltage during test period.
  • Equalization control signal driver receives pull-up and pull-down voltages to equalize voltage levels in an internal bit line pair of a bit line sense amplifier.

Potential Applications

This technology can be applied in semiconductor devices, memory systems, and integrated circuits where precise voltage control is required for optimal performance.

Problems Solved

This technology addresses the need for accurate voltage control in semiconductor devices to ensure proper functioning of internal circuits and components.

Benefits

  • Improved performance and reliability of semiconductor devices.
  • Enhanced voltage control for better overall system operation.
  • Increased efficiency in memory systems and integrated circuits.

Commercial Applications

  • Semiconductor manufacturing industry for producing advanced devices.
  • Memory system manufacturers for optimizing memory performance.
  • Integrated circuit designers for improving circuit functionality.

Prior Art

Prior art related to this technology may include patents or research papers on voltage control circuits in semiconductor devices and memory systems.

Frequently Updated Research

Researchers may be exploring advancements in voltage control techniques for semiconductor devices and memory systems to enhance performance and efficiency.

Questions about Semiconductor Device Technology

How does the equalization control signal driver contribute to the overall performance of the semiconductor device?

The equalization control signal driver ensures that voltage levels are equalized in the internal bit line pair of the bit line sense amplifier, leading to improved functionality and reliability of the device.

What are the potential challenges in implementing the pull-up and pull-down source voltage generation circuits in semiconductor devices?

The implementation of these circuits may face challenges related to power consumption, signal integrity, and integration with existing circuitry.


Original Abstract Submitted

A semiconductor device includes a pull-up source voltage generation circuit configured to drive a pull-up voltage to a normal voltage during a normal period and to drive the pull-source voltage to a test voltage during a test period. The semiconductor device also includes a pull-down source voltage generation circuit configured to drive a pull-down voltage to a ground voltage during the normal period and to drive the pull-down source voltage to a bit line pre-charge voltage during the test period. The semiconductor device further includes an equalization control signal driver configured to receive the pull-up source voltage and the pull-down source voltage to drive an equalization control signal for equalizing voltage levels of an internal bit line pair of a bit line sense amplifier.

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