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Category:G01B11/06
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This category has the following 17 subcategories, out of 17 total.
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Pages in category "G01B11/06"
The following 56 pages are in this category, out of 56 total.
1
- 17586189. OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17915403. Stacking Inspection Apparatus for Electrode Plate or Unit Cell simplified abstract (LG Energy Solution, Ltd.)
- 17955660. SUBSTRATE PROCESSING APPARATUS AND METHOD OF MEASURING FILM THICKNESS simplified abstract (Samsung Display Co., Ltd.)
- 18034831. THICKNESS MEASUREMENT DEVICE simplified abstract (LG ELECTRONICS INC.)
- 18125853. APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT simplified abstract (Samsung Electronics Co., Ltd.)
- 18211456. METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE simplified abstract (Samsung Display Co., LTD.)
- 18212386. APPARATUS AND METHOD FOR INSPECTING AND PUNCHING A DIFFUSION LAYER FOR WATER ELECTROLYSIS simplified abstract (HYUNDAI MOTOR COMPANY)
- 18212386. APPARATUS AND METHOD FOR INSPECTING AND PUNCHING A DIFFUSION LAYER FOR WATER ELECTROLYSIS simplified abstract (KIA CORPORATION)
- 18215437. LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18260317. HIGH FREQUENCY HEATING APPARATUS simplified abstract (PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.)
- 18276155. Method And Device For Measuring Height Of Pouch Cup Portion Accommodating Electrode Assembly simplified abstract (LG Energy Solution, Ltd.)
- 18371230. SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Display Co., LTD.)
- 18457548. DEVICE AND METHOD FOR MEASURING THICKNESS simplified abstract (SAMSUNG DISPLAY CO., LTD.)
- 18472531. HYPER-SPECTRAL MULTI-SPOT OPTICAL REFLECTOMETER (Applied Materials, Inc.)
- 18498194. Methods for measuring thickness and methods for manufacturing a device using the same simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18501672. OPTICAL SENSOR FOR FILM THICKNESS MEASUREMENT (Tokyo Electron Limited)
- 18586090. SAMPLE THICKNESS METROLOGY USING FOCUSED BEAM INTERFERENCE (Applied Materials, Inc.)
- 18594707. SYSTEM AND METHOD TO REDUCE MEASUREMENT ERROR IN INTERFEROMETRY-BASED METROLOGY simplified abstract (KLA Corporation)
- 18616014. ENDPOINT DETECTION SYSTEM FOR ENHANCED SPECTRAL DATA COLLECTION simplified abstract (Applied Materials, Inc.)
- 18639332. MATERIAL MEASUREMENT SYSTEM AND METHOD (SAMSUNG ELECTRONICS CO., LTD.)
- 18799065. MEASUREMENT DEVICE AND MEASUREMENT METHOD (Kioxia Corporation)
- 18944260. METHOD OF MEASURING FILM THICKNESS, AND SUBSTRATE PROCESSING APPARATUS (Tokyo Electron Limited)
A
- Applied materials, inc. (20240410078). IN-SITU FILM GROWTH RATE MONITORING APPARATUS, SYSTEMS, AND METHODS FOR SUBSTRATE PROCESSING
- Applied materials, inc. (20250102356). HYPER-SPECTRAL MULTI-SPOT OPTICAL REFLECTOMETER
- Applied Materials, Inc. patent applications on December 12th, 2024
- Applied Materials, Inc. patent applications on March 27th, 2025
- AR/VR/XR patent applications on June 6th, 2024
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- Samsung display co., ltd. (20240159515). DEVICE AND METHOD FOR MEASURING THICKNESS simplified abstract
- Samsung display co., ltd. (20240219170). SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD simplified abstract
- Samsung Display Co., LTD. patent applications on February 29th, 2024
- Samsung Display Co., LTD. patent applications on July 4th, 2024
- SAMSUNG DISPLAY CO., LTD. patent applications on May 16th, 2024
- Samsung electronics co., ltd. (20240118072). LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240128102). APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT simplified abstract
- Samsung electronics co., ltd. (20240222202). Methods for measuring thickness and methods for manufacturing a device using the same simplified abstract
- Samsung electronics co., ltd. (20240255274). COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250003734). MATERIAL MEASUREMENT SYSTEM AND METHOD
- SAMSUNG ELECTRONICS CO., LTD. patent applications on April 11th, 2024
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on August 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on January 2nd, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 2nd, 2025
- Samsung Electronics Co., Ltd. patent applications on July 4th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on July 4th, 2024
- Saudi Arabian Oil Company patent applications on March 6th, 2025