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Category:G11C29/52
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Pages in category "G11C29/52"
The following 34 pages are in this category, out of 34 total.
1
- 17821608. CALIBRATION OF THRESHOLD VOLTAGE SHIFT VALUES simplified abstract (International Business Machines Corporation)
- 17831329. GLITCH DETECTION REDUNDANCY simplified abstract (Micron Technology, Inc.)
- 17838481. Storage System and Method for Inference of Read Thresholds Based on Memory Parameters and Conditions simplified abstract (Western Digital Technologies, Inc.)
- 17854638. METHOD OF ERROR CORRECTION CODE (ECC) DECODING AND MEMORY SYSTEM PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17862082. DIFFERENTIAL STROBE FAULT INDICATION simplified abstract (Micron Technology, Inc.)
- 17888225. ADAPTIVE SENSING TIME FOR MEMORY OPERATIONS simplified abstract (Micron Technology, Inc.)
- 17889369. ERROR DETECTION FOR A SEMICONDUCTOR DEVICE simplified abstract (Micron Technology, Inc.)
- 17894528. ADAPTIVE ERROR AVOIDANCE IN THE MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17898725. BLOCK FAMILY ERROR AVOIDANCE BIN SCANS AFTER MEMORY DEVICE POWER-ON simplified abstract (Micron Technology, Inc.)
- 17899417. MANAGING PERFORMANCE AND SERVICE LIFE PREDICTION FOR A MEMORY SUBSYSTEM USING ENVIRONMENTAL FACTORS simplified abstract (Micron Technology, Inc.)
- 17956784. Data Storage with Improved Cache Read simplified abstract (Western Digital Technologies, Inc.)
- 17959191. POST PACKAGE REPAIR MANAGEMENT simplified abstract (Micron Technology, Inc.)
- 17986556. STORAGE DEVICE AND STORAGE SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18080282. MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE simplified abstract (SK hynix Inc.)
- 18132472. DATA STORAGE DEVICE FOR CHECKING A DEFECT OF ROW LINES AND AN OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18164349. SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS INCLUDING THE SAME AND METHODS OF OPERATING MEMORY SYSTEMS simplified abstract (Samsung Electronics Co., Ltd.)
- 18166737. MEMORY DEVICE, MEMORY SYSTEM AND METHOD FOR OPERATING MEMORY SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 18169610. ERROR DETECTION, CORRECTION, AND MEDIA MANAGEMENT ON A DRAM DEVICE simplified abstract (Micron Technology, Inc.)
- 18169635. SELECTIVE PER DIE DRAM PPR FOR CXL TYPE 3 DEVICE simplified abstract (Micron Technology, Inc.)
- 18228291. MEMORY DEVICE PRODUCING METADATA CHARACTERIZING APPLIED READ VOLTAGE LEVEL WITH RESPECT TO VOLTAGE DISTRIBUTIONS simplified abstract (Micron Technology, Inc.)
- 18522343. MEMORY SYSTEM simplified abstract (Kioxia Corporation)