There is currently no text in this page. You can search for this page title in other pages, or search the related logs, but you do not have permission to create this page.
Category:G11C29/00
Subcategories
This category has the following 41 subcategories, out of 41 total.
A
D
F
G
H
I
J
K
L
M
P
R
S
T
W
X
Y
Z
Pages in category "G11C29/00"
The following 95 pages are in this category, out of 95 total.
1
- 17731994. SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17822032. SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17823740. MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR simplified abstract (Micron Technology, Inc.)
- 17889369. ERROR DETECTION FOR A SEMICONDUCTOR DEVICE simplified abstract (Micron Technology, Inc.)
- 18062843. MEMORY DEVICE FOR OUTPUTTING TEST RESULTS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18091258. MEMORY AND METHOD WITH IN-MEMORY COMPUTING DEFECT DETECTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18093560. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18149302. MEMORY DEVICE FOR COLUMN REPAIR simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18169610. ERROR DETECTION, CORRECTION, AND MEDIA MANAGEMENT ON A DRAM DEVICE simplified abstract (Micron Technology, Inc.)
- 18169635. SELECTIVE PER DIE DRAM PPR FOR CXL TYPE 3 DEVICE simplified abstract (Micron Technology, Inc.)
- 18295851. MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING METHOD THEREOF simplified abstract (SK hynix Inc.)
- 18314147. MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE simplified abstract (SK hynix Inc.)
- 18334614. ONE-TIME-PROGRAMMABLE (OTP) MEMORY WITH ERROR DETECTION (NXP USA, Inc.)
- 18369014. ERROR CONDITION MONITORING IN MEMORY SYSTEMS (SK hynix Inc.)
- 18409241. MEMORY DEVICE, AND MEMORY SYSTEM AND OPERATION METHOD THEREOF (YANGTZE MEMORY TECHNOLOGIES CO., LTD.)
- 18411412. ELECTRONIC SYSTEM RELATED TO DETECTING A RESULT OF A RUPTURE OPERATION (SK hynix Inc.)
- 18443347. MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOCIATED TEST METHOD simplified abstract (MEDIATEK INC.)
- 18448346. SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18466110. STATIC RANDOM ACCESS MEMORY (SRAM) FAULT CORRECTION (QUALCOMM Incorporated)
- 18495883. STORAGE UNIT ACCESS METHOD, STORAGE UNIT REPAIR METHOD, DIE, AND MEMORY CHIP simplified abstract (Huawei Technologies Co., Ltd.)
- 18504353. APPARATUSES AND METHODS FOR SEPARATE WRITE ENABLE FOR SINGLE-PASS ACCESS OF DATA, METADATA, AND PARITY INFORMATION simplified abstract (Micron Technology, Inc.)
- 18582654. CONTROLLER FOR MANAGING BAD BLOCK, STORAGE DEVICE INCLUDING THE SAME, AND METHOD OF OPERATING THE STORAGE DEVICE (SK hynix Inc.)
- 18583294. MEMORY APPARATUS AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18603960. LOGIC MODULE FOR USE WITH ENCODED INSTRUCTIONS simplified abstract (Pure Storage, Inc.)
- 18665817. MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF (SAMSUNG ELECTRONICS CO., LTD.)
- 18747712. APPARATUSES AND METHODS FOR GRANULAR SINGLE-PASS METADATA ACCESS OPERATIONS (Micron Technology, Inc.)
- 18749098. METHOD AND SYSTEM FOR REPLACEMENT OF MEMORY CELLS simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18775881. MEMORY REPAIRS (Micron Technology, Inc.)
- 18775981. SPARING TECHNIQUES IN STACKED MEMORY ARCHITECTURES (Micron Technology, Inc.)
- 18782624. FLEXIBLE ADDRESS SWAP COLUMN REDUNDANCY (Micron Technology, Inc.)
- 18788730. MIXED-MODE VIRTUAL BLOCK GENERATION (Micron Technology, Inc.)
- 18958550. OPTIMIZING VOLTAGE TUNING USING PRIOR VOLTAGE TUNING RESULTS (PURE STORAGE, INC.)
- 18970293. MEMORY ISOLATION TO IMPROVE SYSTEM RELIABILITY (Intel Corporation)
- 18970723. MEMORY AND OPERATION METHOD THEREOF (SK hynix Inc.)
- 18979331. READ WINDOW MANAGEMENT IN A MEMORY SYSTEM (Micron Technology, Inc.)
- 19020347. 3D STACKED INTEGRATED CIRCUITS HAVING FUNCTIONAL BLOCKS CONFIGURED TO PROVIDE REDUNDANCY SITES (Micron Technology, Inc.)
G
I
- Intel corporation (20240354209). PERSISTENT DATA STRUCTURE TO TRACK AND MANAGE SSD DEFECTS simplified abstract
- Intel corporation (20250104797). MEMORY ISOLATION TO IMPROVE SYSTEM RELIABILITY
- Intel Corporation patent applications on January 18th, 2024
- Intel Corporation patent applications on March 27th, 2025
- Intel Corporation patent applications on October 24th, 2024
M
- Micron technology, inc. (20240161859). APPARATUSES AND METHODS FOR SEPARATE WRITE ENABLE FOR SINGLE-PASS ACCESS OF DATA, METADATA, AND PARITY INFORMATION simplified abstract
- Micron technology, inc. (20240203520). SEMICONDUCTOR DEVICE HAVING MEMORY CELL ARRAY DIVIDED INTO PLURAL MEMORY MATS simplified abstract
- Micron technology, inc. (20240265992). SEMICONDUCTOR DEVICE HAVING FUSE ARRAY simplified abstract
- Micron technology, inc. (20250069683). FLEXIBLE ADDRESS SWAP COLUMN REDUNDANCY
- Micron technology, inc. (20250087294). MEMORY REPAIRS
- Micron technology, inc. (20250104799). MIXED-MODE VIRTUAL BLOCK GENERATION
- Micron technology, inc. (20250111886). READ WINDOW MANAGEMENT IN A MEMORY SYSTEM
- Micron technology, inc. (20250111887). APPARATUSES AND METHODS FOR GRANULAR SINGLE-PASS METADATA ACCESS OPERATIONS
- Micron technology, inc. (20250149108). SPARING TECHNIQUES IN STACKED MEMORY ARCHITECTURES
- Micron technology, inc. (20250149531). 3D STACKED INTEGRATED CIRCUITS HAVING FUNCTIONAL BLOCKS CONFIGURED TO PROVIDE REDUNDANCY SITES
- Micron Technology, Inc. patent applications on April 3rd, 2025
- Micron Technology, Inc. patent applications on August 8th, 2024
- Micron Technology, Inc. patent applications on February 20th, 2025
- Micron Technology, Inc. patent applications on February 27th, 2025
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on January 18th, 2024
- Micron Technology, Inc. patent applications on January 30th, 2025
- Micron Technology, Inc. patent applications on June 20th, 2024
- Micron Technology, Inc. patent applications on March 13th, 2025
- Micron Technology, Inc. patent applications on March 27th, 2025
- Micron Technology, Inc. patent applications on May 16th, 2024
- Micron Technology, Inc. patent applications on May 8th, 2025
Q
S
- Samsung electronics co., ltd. (20240221860). SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE simplified abstract
- Samsung electronics co., ltd. (20240257889). STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR
- Samsung electronics co., ltd. (20240257889). STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR simplified abstract
- Samsung electronics co., ltd. (20240257898). MEMORY DEVICE AND REPAIR METHOD OF THE MEMORY DEVICE
- Samsung electronics co., ltd. (20240257898). MEMORY DEVICE AND REPAIR METHOD OF THE MEMORY DEVICE simplified abstract
- Samsung electronics co., ltd. (20250069682). MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF
- Samsung electronics co., ltd. (20250078947). MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
- Samsung Electronics Co., Ltd. patent applications on August 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on February 27th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 27th, 2025
- Samsung Electronics Co., Ltd. patent applications on February 29th, 2024
- Samsung Electronics Co., Ltd. patent applications on July 4th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on July 4th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 6th, 2025
- Sk hynix inc. (20240161861). MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING METHOD THEREOF simplified abstract
- Sk hynix inc. (20240177793). MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE simplified abstract
- Sk hynix inc. (20250095765). ERROR CONDITION MONITORING IN MEMORY SYSTEMS
- Sk hynix inc. (20250095769). MEMORY AND OPERATION METHOD THEREOF
- Sk hynix inc. (20250125002). ELECTRONIC SYSTEM RELATED TO DETECTING A RESULT OF A RUPTURE OPERATION
- SK hynix Inc. patent applications on April 17th, 2025
- SK hynix Inc. patent applications on March 20th, 2025
- SK hynix Inc. patent applications on May 16th, 2024
- SK hynix Inc. patent applications on May 30th, 2024