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Category:G11C29/46
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Pages in category "G11C29/46"
The following 23 pages are in this category, out of 23 total.
1
- 17697240. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17807314. ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17808043. INTERRUPTING A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17815742. INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST USING A DATA MASK INVERSION BIT simplified abstract (Micron Technology, Inc.)
- 17822032. SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18059124. MEMORY DEVICE AND TEST METHOD OF MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18100969. TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18174186. SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18330404. MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18455031. METHOD FOR OPTIMIZING FLASH MEMORY CHIP AND RELATED APPARATUS simplified abstract (HUAWEI TECHNOLOGIES CO., LTD.)
M
- Micron technology, inc. (20240127901). TEMPERATURE-BASED ERROR MASKING DURING MBIST OPERATION simplified abstract
- Micron technology, inc. (20240127902). INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST simplified abstract
- Micron Technology, Inc. patent applications on April 18th, 2024
- Micron Technology, Inc. patent applications on February 1st, 2024
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on February 8th, 2024
- Micron Technology, Inc. patent applications on January 18th, 2024
S
- Samsung electronics co., ltd. (20240127879). MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 25th, 2024
- Sk hynix inc. (20240120014). TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024