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Category:G01R31/26
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Pages in category "G01R31/26"
The following 28 pages are in this category, out of 28 total.
1
- 17528340. USAGE METERING TO PREVENT IC COUNTERFEIT simplified abstract (International Business Machines Corporation)
- 17534629. Reliability Macros for Contact Over Active Gate Layout Designs simplified abstract (International Business Machines Corporation)
- 17816619. SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17825087. COMPUTING DEVICES FOR PREDICTING ELECTRICAL TESTS, ELECTRICAL TEST PREDICTION APPARATUSES HAVING THE SAME, AND OPERATING METHODS THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 17885071. Fast Transient Detection simplified abstract (Google LLC)
- 18093669. TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMS simplified abstract (Samsung Display Co., Ltd.)
- 18244559. TRANSMITTING AND RECEIVING CIRCUIT AND TEST DEVICE INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18311772. TEST DEVICE FOR DETERMINING AN EFFECTIVE WORK FUNCTION, METHOD OF MANUFACTURING THE SAME AND METHOD OF DETERMINING AN EFFECTIVE WORK FUNCTION simplified abstract (SK hynix Inc.)
- 18454404. TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT simplified abstract (Samsung Electronics Co., Ltd.)
- 18521585. Enclosure Detection for Reliable Optical Failsafe simplified abstract (Apple Inc.)
- 18538012. METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE simplified abstract (DENSO CORPORATION)
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- Samsung display co., ltd. (20240102921). OPTICAL INSPECTION APPARATUS simplified abstract
- Samsung Display Co., Ltd. patent applications on March 28th, 2024
- Samsung electronics co., ltd. (20240125841). TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 14th, 2024
- Sk hynix inc. (20240118332). TEST DEVICE FOR DETERMINING AN EFFECTIVE WORK FUNCTION, METHOD OF MANUFACTURING THE SAME AND METHOD OF DETERMINING AN EFFECTIVE WORK FUNCTION simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024