17528340. USAGE METERING TO PREVENT IC COUNTERFEIT simplified abstract (International Business Machines Corporation)

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USAGE METERING TO PREVENT IC COUNTERFEIT

Organization Name

International Business Machines Corporation

Inventor(s)

Effendi Leobandung of Stormville NY (US)

USAGE METERING TO PREVENT IC COUNTERFEIT - A simplified explanation of the abstract

This abstract first appeared for US patent application 17528340 titled 'USAGE METERING TO PREVENT IC COUNTERFEIT

Simplified Explanation

The patent application describes a timer circuit that includes several n-type field effect transistors (NFETs) powered by a current source. Each NFET is connected to an electromigration detection element, and a read-out circuit is connected to these detection elements to measure the usage of each NFET.

  • The timer circuit consists of multiple NFETs powered by a current source.
  • Each NFET is connected to an electromigration detection element.
  • A read-out circuit is connected to the detection elements to measure the usage of each NFET.

Potential Applications:

  • This technology can be used in various timing applications, such as timers in electronic devices, appliances, or industrial equipment.
  • It can also be utilized in power management systems to monitor and control the usage of NFETs.

Problems Solved:

  • The timer circuit allows for accurate measurement and monitoring of the usage of NFETs.
  • It helps in identifying potential issues related to electromigration in NFETs, which can lead to device failure.

Benefits:

  • The circuit provides a reliable and efficient method for measuring the usage of NFETs.
  • It enables better management and optimization of NFETs, leading to improved device performance and longevity.
  • The detection of electromigration can help prevent device failures and improve overall reliability.


Original Abstract Submitted

A timer circuit includes a plurality of n-type field effect transistors (NFETs) powered by a current source, a plurality of electromigration detection elements each electrically connected to a respective NFET of the plurality of NFETs, and a read-out circuit electrically connected to the plurality of electromigration detection elements to meter usage of each of the NFETs.

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