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Category:H01J37/20
Subcategories
This category has the following 24 subcategories, out of 24 total.
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Pages in category "H01J37/20"
The following 55 pages are in this category, out of 55 total.
1
- 18091041. XRAY DIFFRACTION ANGLE VERIFICATION IN AN ION IMPLANTER simplified abstract (Applied Materials, Inc.)
- 18156217. ROBOT, APPARATUS INCLUDING ROBOT, AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE USING THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18196499. SUBSTRATE ANALYSIS SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 18226644. ION BEAM DEPOSITION APPARATUS AND ION BEAM DEPOSITION METHOD USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18295466. PLASMA PROCESSING APPARATUS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18366322. APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18366355. GUIDE PIN, SYSTEM FOR PRECISELY CONTROLLING SPECIMEN INCLUDING THE SAME, AND METHOD FOR OBSERVING SPECIMEN USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18406925. GRID STRUCTURE FOR FIXING SPECIMEN simplified abstract (Samsung Electronics Co., Ltd.)
- 18462647. NANOFLUIDIC CELL FOR CHARACTERIZATION OF NANO-BUBBLES IN A SIMULATED RESERVOIR (Saudi Arabian Oil Company)
- 18593629. DRAWING DEVICE AND DRAWING METHOD simplified abstract (Kioxia Corporation)
- 18598613. METHOD FOR DETERMINING AMOUNT OF WEAR OF EDGE RING, PLASMA PROCESSING APPARATUS, AND SUBSTRATE PROCESSING SYSTEM simplified abstract (Tokyo Electron Limited)
- 18628269. UPPER ELECTRODE STRUCTURE AND PLASMA PROCESSING APPARATUS simplified abstract (Tokyo Electron Limited)
- 18648278. ULTRATHIN CONFORMAL COATINGS FOR ELECTROSTATIC DISSIPATION IN SEMICONDUCTOR PROCESS TOOLS simplified abstract (Applied Materials, Inc.)
- 18709795. METHOD AND SYSTEM OF REDUCING CHAMBER VIBRATION (ASML Netherlands B.V.)
- 18748694. METHOD OF PROCESSING A SAMPLE, AND CHARGED PARTICLE ASSESSMENT SYSTEM simplified abstract (ASML Netherlands B.V.)
- 18794728. CONOSCOPIC WAFER ORIENTATION APPARATUS AND ION IMPLANTER INCLUDING SAME (Applied Materials, Inc.)
- 18814175. APPARATUS AND METHODS FOR BEAM PROCESSING OF SUBSTRATES (Tokyo Electron Limited)
- 18835838. Ion Milling Device, and Inspection System (HITACHI HIGH-TECH CORPORATION)
- 18838013. Ion Milling Device (HITACHI HIGH-TECH CORPORATION)
- 18895633. OPERANDO SCANNING ELECTRON MICROSCOPY PLATFORM AND METHODS OF USING THE SAME (BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM)
- 18917129. Liquid cells for the study of electrochemical processes using transmission electron microscopy (THE REGENTS OF THE UNIVERSITY OF CALIFORNIA)
- 18979967. METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE (ASML Netherlands B.V.)
- 19012150. ION MILLING DEVICE (HITACHI HIGH-TECH CORPORATION)
A
- Applied materials, inc. (20240284650). ULTRATHIN CONFORMAL COATINGS FOR ELECTROSTATIC DISSIPATION IN SEMICONDUCTOR PROCESS TOOLS simplified abstract
- Applied materials, inc. (20250095952). CONOSCOPIC WAFER ORIENTATION APPARATUS AND ION IMPLANTER INCLUDING SAME
- Applied Materials, Inc. patent applications on August 22nd, 2024
- Applied Materials, Inc. patent applications on March 20th, 2025
- Applied Materials, Inc. patent applications on March 6th, 2025
B
K
S
- Samsung electronics co., ltd. (20240105417). SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR DEVICE INSPECTION METHOD USING THE SAMPLE HOLDER simplified abstract
- Samsung electronics co., ltd. (20240112881). SUBSTRATE ANALYSIS SYSTEM simplified abstract
- Samsung electronics co., ltd. (20240203686). GUIDE PIN, SYSTEM FOR PRECISELY CONTROLLING SPECIMEN INCLUDING THE SAME, AND METHOD FOR OBSERVING SPECIMEN USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract
- Samsung electronics co., ltd. (20240242989). GRID STRUCTURE FOR FIXING SPECIMEN simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 4th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on February 29th, 2024
- Samsung Electronics Co., Ltd. patent applications on July 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 28th, 2024
- Saudi arabian oil company (20250087443). NANOFLUIDIC CELL FOR CHARACTERIZATION OF NANO-BUBBLES IN A SIMULATED RESERVOIR
- Saudi Arabian Oil Company patent applications on March 13th, 2025
T
- Taiwan semiconductor manufacturing company, ltd. (20240243001). ROBOT, APPARATUS INCLUDING ROBOT, AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE USING THE SAME simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on July 18th, 2024
- The regents of the university of california (20240412942). APPARATUS FOR PREPARING ELECTRON MICROSCOPY SAMPLES AND METHODS OF USE THEREOF
- The regents of the university of california (20250140514). Liquid cells for the study of electrochemical processes using transmission electron microscopy
- The Regents of the University of California patent applications on December 12th, 2024
- THE REGENTS OF THE UNIVERSITY OF CALIFORNIA patent applications on May 1st, 2025
- Tokyo electron limited (20240249907). UPPER ELECTRODE STRUCTURE AND PLASMA PROCESSING APPARATUS simplified abstract
- Tokyo Electron Limited patent applications on July 25th, 2024