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Category:G01R1/073
Subcategories
This category has the following 13 subcategories, out of 13 total.
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Pages in category "G01R1/073"
The following 61 pages are in this category, out of 61 total.
1
- 17390835. Methods for Making Probe Arrays Utilizing Deformed Templates simplified abstract (Microfabrica Inc.)
- 17464612. Methods of Reinforcing Plated Metal Structures and Independently Modulating Mechanical Properties Using Nano-Fibers simplified abstract (Microfabrica Inc.)
- 17507598. Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes simplified abstract (Microfabrica Inc.)
- 17571537. POGO PIN-FREE TESTING DEVICE FOR IC CHIP TEST AND TESTING METHOD OF IC CHIP simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17888384. Multi-Beam Probes with Decoupled Structural and Current Carrying Beams and Methods of Making simplified abstract (Microfabrica Inc.)
- 17898446. Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using simplified abstract (Microfabrica Inc.)
- 17968552. Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes simplified abstract (Microfabrica Inc.)
- 17968601. Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes simplified abstract (Microfabrica Inc.)
- 17968638. Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes simplified abstract (Microfabrica Inc.)
- 18110572. AUTOMATIC BOARD PROBING STATION simplified abstract (NVIDIA Corporation)
- 18148717. METHODS AND APPARATUS TO DETECT DEFECTS DURING SEMICONDUCTOR CHIP FABRICATION AND/OR TO DEBUG SEMICONDUCTOR CHIPS AFTER FABRICATION simplified abstract (Intel Corporation)
- 18180101. TESTING APPARATUS simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18264319. METHOD FOR SETTING UP TEST APPARATUS AND TEST APPARATUS simplified abstract (Tokyo Electron Limited)
- 18319507. PROBE CARD AND CALIBRATION METHOD FOR PROBER simplified abstract (United Microelectronics Corp.)
- 18389625. INTEGRATED CIRCUIT DEVICE STRUCTURES AND DOUBLE-SIDED ELECTRICAL TESTING simplified abstract (Intel Corporation)
- 18437119. SEMICONDUCTOR MANUFACTURING APPARATUS (Kabushiki Kaisha Toshiba)
- 18437119. SEMICONDUCTOR MANUFACTURING APPARATUS (TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION)
- 18466017. DISPLAY PANEL INSPECTION DEVICE AND DISPLAY PANEL INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., LTD.)
- 18481691. SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELECTRICAL SYSTEM (Hamilton Sundstrand Corporation)
- 18592221. TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18603091. MULTI-SITE CONCURRENT WAFER PROBE MAGNETIC CIRCUIT TESTING simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18606516. WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18609105. SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD simplified abstract (Mitsubishi Electric Corporation)
- 18671017. PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INCLUDING THE SAME (SAMSUNG ELECTRONICS CO., LTD.)
- 18817410. PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APPARATUS (Kioxia Corporation)
- 18906148. APPARATUS FOR TESTING INTEGRATED CIRCUITS (MEDIATEK INC.)
2
- 20240012028. LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFACTURING METHOD simplified abstract (TECHNOPROBE S.P.A.)
- 20240036107. TEST DEVICE simplified abstract (teCat Technologies (Suzhou) Limited)
- 20240044940. CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES simplified abstract (TECHNOPROBE S.P.A.)
B
C
- Contemporary amperex technology co., limited (20240243372). BATTERY TEST ASSEMBLY, BATTERY ASSEMBLY, CHARGING ASSEMBLY, AND ELECTRIC DEVICE simplified abstract
- Contemporary amperex technology co., limited (20240426873). TEST APPARATUS AND BATTERY PRODUCTION LINE
- Contemporary amperex technology co., limited (20240429473). BATTERY TEST APPARATUS
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED patent applications on December 26th, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED patent applications on July 18th, 2024
I
- Intel corporation (20240194533). INTEGRATED CIRCUIT DEVICE STRUCTURES AND DOUBLE-SIDED ELECTRICAL TESTING simplified abstract
- Intel corporation (20240219894). METHODS AND APPARATUS TO DETECT DEFECTS DURING SEMICONDUCTOR CHIP FABRICATION AND/OR TO DEBUG SEMICONDUCTOR CHIPS AFTER FABRICATION simplified abstract
- Intel Corporation patent applications on July 4th, 2024
- Intel Corporation patent applications on June 13th, 2024
K
- Kabushiki kaisha toshiba (20250087526). SEMICONDUCTOR MANUFACTURING APPARATUS
- Kabushiki Kaisha Toshiba patent applications on March 13th, 2025
- Kioxia corporation (20250093384). PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APPARATUS
- Kioxia Corporation patent applications on March 20th, 2025
N
S
- Samsung display co., ltd. (20240219424). DISPLAY PANEL INSPECTION DEVICE AND DISPLAY PANEL INSPECTION METHOD USING THE SAME simplified abstract
- Samsung Display Co., LTD. patent applications on July 4th, 2024
- Samsung electronics co., ltd. (20240310439). TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240319229). WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20250138088). PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INCLUDING THE SAME
- Samsung Electronics Co., Ltd. patent applications on May 1st, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on May 1st, 2025
- Samsung Electronics Co., Ltd. patent applications on September 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on September 19th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 26th, 2024
- Sk hynix inc. (20240264038). PROBE CARD simplified abstract
- SK hynix Inc. patent applications on August 8th, 2024