APPARATUS FOR TESTING INTEGRATED CIRCUITS

Organization Name

MEDIATEK INC.

Inventor(s)

Jing-Hui Zhuang of Hsinchu City TW

Ying-Chou Shih of Hsinchu City TW

Chang-Lin Wei of Hsinchu City TW

Sheng-Wei Lei of Hsinchu City TW

Chih-Yang Liu of Hsinchu City TW

Jhih-Huei Chiu of Hsinchu City TW

Yen-Hui Li of Hsinchu City TW

Che-Sheng Lin of Hsinchu City TW

APPARATUS FOR TESTING INTEGRATED CIRCUITS

This abstract first appeared for US patent application 18906148 titled 'APPARATUS FOR TESTING INTEGRATED CIRCUITS

Original Abstract Submitted

A probe head includes an upper pin holder and a lower pin holder coupled to the upper pin holder. A pin arrangement space is defined between the upper pin holder and the lower pin holder. A conductive film is disposed between the upper pin holder and the lower pin holder. A plurality of probe pins penetrates through the upper pin holder, the conductor film and the lower pin holder, and extends outwardly from a bottom surface of the lower pin holder.