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Category:G11C29/36
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Pages in category "G11C29/36"
The following 15 pages are in this category, out of 15 total.
1
- 17697240. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17944135. BUILT-IN SELF-TEST CIRCUITRY simplified abstract (Micron Technology, Inc.)
- 18059124. MEMORY DEVICE AND TEST METHOD OF MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18059462. BUILT-IN SELF-TEST CIRCUITS FOR MEMORY SYSTEMS HAVING MULTIPLE CHANNELS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18091258. MEMORY AND METHOD WITH IN-MEMORY COMPUTING DEFECT DETECTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18229981. MEMORY QUEUE OPERATIONS TO INCREASE THROUGHPUT IN AN ATE SYSTEM simplified abstract (ADVANTEST CORPORATION)
- 18238096. TECHNOLOGIES FOR ALLOCATING RESOURCES ACROSS DATA CENTERS simplified abstract (Intel Corporation)
- 18314508. OPERATING AND TESTING SEMICONDUCTOR DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18392740. AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES simplified abstract (Texas Instruments Incorporated)
- 18475968. BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODULE TESTING METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18486789. CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)