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Category:G01N21/17
Subcategories
This category has the following 22 subcategories, out of 22 total.
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Pages in category "G01N21/17"
The following 57 pages are in this category, out of 57 total.
1
- 17423941. ANALYSIS DEVICE FOR DETECTION CHIP AND METHOD OF OPERATING THEREOF, AND ANALYSIS SYSTEM simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)
- 18069885. SEMI-COMPACT PHOTOACOUSTIC DEVICES AND SYSTEMS simplified abstract (QUALCOMM Incorporated)
- 18069888. SEMI-COMPACT PHOTOACOUSTIC DEVICES AND SYSTEMS simplified abstract (QUALCOMM Incorporated)
- 18069893. SEMI-COMPACT PHOTOACOUSTIC DEVICES AND SYSTEMS simplified abstract (QUALCOMM Incorporated)
- 18069901. PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE COMPONENTS simplified abstract (QUALCOMM Incorporated)
- 18287476. A METHOD OF DETECTING ONE OR MORE MARKERS IN A PETROLEUM FUEL USING A PHOTOACOUSTIC DETECTOR simplified abstract (BASF SE)
- 18408247. SEMICONDUCTOR MEASUREMENT APPARATUS (SAMSUNG ELECTRONICS CO., LTD.)
- 18434855. DETERMINATION DEVICE AND IMAGE FORMING APPARATUS (FUJIFILM BUSINESS INNOVATION CORP.)
- 18492191. COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN AND METHODS (RTX CORPORATION)
- 18520807. HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY STRENGTHENED TRANSPARENT SUBSTRATES simplified abstract (CORNING INCORPORATED)
- 18551671. PHOTODETECTION DEVICE AND ELECTRONIC DEVICE simplified abstract (SONY SEMICONDUCTOR SOLUTIONS CORPORATION)
- 18603205. GAS SENSOR AND OPTICAL DEVICE simplified abstract (Asahi Kasei Microdevices Corporation)
- 18611653. CONE PENETROMETER AND METHOD FOR DETECTING MULTI-POLLUTANTS BASED ON TIME DOMAIN REFLECTOMETRY AND LASER INDUCED FLUORESCENCE simplified abstract (Zhejiang University)
- 18626733. PHOTOACOUSTIC CUVETTE PLATFORM simplified abstract (Arizona Board of Regents on behalf of Arizona State University)
- 18830121. SEMICONDUCTOR DEVICES, MICROELECTROMECHANICAL SYSTEM GAS SENSOR, METHODS (Infineon Technologies AG)
- 18835752. NON-INVASIVE SUBSTANCE ANALYZER (Mitsubishi Electric Corporation)
- 18887698. LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPARATUS INCLUDING THE SAME, AND SKIN ANALYZING APPARATUS INCLUDING THE IMAGING APPARATUS (SAMSUNG ELECTRONICS CO., LTD.)
- 18891134. IMAGING APPARATUS (Panasonic Intellectual Property Management Co., Ltd.)
- 18909623. THERMAL EMITTER, METHOD FOR OPERATING A THERMAL EMITTER AND MEMS GAS/FLUID SENSOR (Infineon Technologies AG)
- 18911499. INK JET PRINTER (KEYENCE CORPORATION)
- 19018010. DETECTION DEVICE (Japan Display Inc.)
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- Qualcomm incorporated (20240206739). SEMI-COMPACT PHOTOACOUSTIC DEVICES AND SYSTEMS simplified abstract
- Qualcomm incorporated (20240210308). SEMI-COMPACT PHOTOACOUSTIC DEVICES AND SYSTEMS simplified abstract
- Qualcomm incorporated (20240210309). SEMI-COMPACT PHOTOACOUSTIC DEVICES AND SYSTEMS simplified abstract
- Qualcomm incorporated (20240210359). PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE COMPONENTS simplified abstract
- QUALCOMM Incorporated patent applications on June 27th, 2024
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- SafeNet International LLC (20250012714). Hyperspectral Sensing System and Method for Tracing/Tracking Refined Oil Products
- Samsung display co., ltd. (20240102921). OPTICAL INSPECTION APPARATUS simplified abstract
- Samsung Display Co., Ltd. patent applications on March 28th, 2024
- Samsung electronics co., ltd. (20240418645). SEMICONDUCTOR MEASUREMENT APPARATUS
- Samsung electronics co., ltd. (20250093261). LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPARATUS INCLUDING THE SAME, AND SKIN ANALYZING APPARATUS INCLUDING THE IMAGING APPARATUS
- Samsung Electronics Co., Ltd. patent applications on December 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on December 19th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 20th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 20th, 2025
- Seiko epson corporation (20240241051). SPECTROSCOPIC MEASUREMENT METHOD, SPECTROMETER, AND SPECTROSCOPIC MEASUREMENT PROGRAM simplified abstract
- SEIKO EPSON CORPORATION patent applications on July 18th, 2024
- Sony group corporation (20240241040). INSPECTION APPARATUS AND INSPECTION METHOD simplified abstract
- Sony Group Corporation patent applications on July 18th, 2024