NON-INVASIVE SUBSTANCE ANALYZER

Organization Name

Mitsubishi Electric Corporation

Inventor(s)

Shusaku Hayashi of Chiyoda-ku, Tokyo JP

Koichi Akiyama of Chiyoda-ku, Tokyo JP

Yuki Tsuda of Chiyoda-ku, Tokyo JP

NON-INVASIVE SUBSTANCE ANALYZER

This abstract first appeared for US patent application 18835752 titled 'NON-INVASIVE SUBSTANCE ANALYZER

Original Abstract Submitted

The non-invasive substance analyzer includes an optical waveguide circuit, a probe light source, and a light intensity detector. The optical waveguide circuit has a sample mounting region. The probe light source emits probe light. The optical waveguide circuit includes a first optical waveguide to which the probe light is incident, a waveguide-type ring resonator, and a second optical waveguide. The light intensity detector detects an intensity of first light which is a part of the probe light and is optically coupled to the second optical waveguide.