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Category:G11C29/00
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Pages in category "G11C29/00"
The following 18 pages are in this category, out of 18 total.
1
- 17731994. SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17822032. SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17823740. MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR simplified abstract (Micron Technology, Inc.)
- 17889369. ERROR DETECTION FOR A SEMICONDUCTOR DEVICE simplified abstract (Micron Technology, Inc.)
- 18062843. MEMORY DEVICE FOR OUTPUTTING TEST RESULTS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18091258. MEMORY AND METHOD WITH IN-MEMORY COMPUTING DEFECT DETECTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18093560. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18149302. MEMORY DEVICE FOR COLUMN REPAIR simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18169610. ERROR DETECTION, CORRECTION, AND MEDIA MANAGEMENT ON A DRAM DEVICE simplified abstract (Micron Technology, Inc.)
- 18169635. SELECTIVE PER DIE DRAM PPR FOR CXL TYPE 3 DEVICE simplified abstract (Micron Technology, Inc.)
- 18495883. STORAGE UNIT ACCESS METHOD, STORAGE UNIT REPAIR METHOD, DIE, AND MEMORY CHIP simplified abstract (Huawei Technologies Co., Ltd.)