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Category:H01L27/11597
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Pages in category "H01L27/11597"
The following 11 pages are in this category, out of 11 total.
1
- 17526774. SYSTEMS AND METHODS OF TESTING MEMORY DEVICES simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 17585932. SEMICONDUCTOR DIES INCLUDING LOW AND HIGH WORKFUNCTION SEMICONDUCTOR DEVICES simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17667873. SEMICONDUCTOR MEMORY STRUCTURE AND METHOD FOR FORMING THE SAME simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17703201. THIN FILM STRUCTURE AND ELECTRONIC DEVICE INCLUDING TWO-DIMENSIONAL MATERIAL simplified abstract (Samsung Electronics Co., Ltd.)
- 17726086. COMPUTE-IN-MEMORY DEVICE AND METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17818839. Three-Dimensional Memory Device and Method simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17835769. SEMICONDUCTOR MEMORY DEVICES AND METHODS OF MANUFACTURING THEREOF simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 17932942. THREE-DIMENSIONAL MEMORY DEVICE AND METHOD OF MAKING THEREOF USING SELECTIVE METAL NITRIDE DEPOSITION ON DIELECTRIC METAL OXIDE BLOCKING DIELECTRIC simplified abstract (SanDisk Technologies LLC)
- 17952637. SEMICONDUCTOR DEVICES AND MANUFACTURING METHODS FOR THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)