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Category:G11C29/18
Subcategories
This category has the following 20 subcategories, out of 20 total.
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Pages in category "G11C29/18"
The following 61 pages are in this category, out of 61 total.
1
- 17697240. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17823450. Dynamic Address Scramble simplified abstract (Micron Technology, Inc.)
- 18062843. MEMORY DEVICE FOR OUTPUTTING TEST RESULTS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18068337. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18093560. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18100969. TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18101123. SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM PERFORMING ERROR CORRECTION OPERATION simplified abstract (SK hynix Inc.)
- 18116019. TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPLE MEMORY DEVICES simplified abstract (SK hynix Inc.)
- 18320088. SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE simplified abstract (SK hynix Inc.)
- 18362130. MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED TO OCCURRENCES OF ERRORS AND OPERATING METHODS OF MEMORY DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18411412. ELECTRONIC SYSTEM RELATED TO DETECTING A RESULT OF A RUPTURE OPERATION (SK hynix Inc.)
- 18531162. STORAGE DEVICE USING HOST MEMORY BUFFER AND METHOD OF OPERATING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18583294. MEMORY APPARATUS AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18596939. SEMICONDUCTOR SYSTEM FOR DETECTING FAIL LOCATION (SK hynix Inc.)
- 18598937. APPARATUSES, SYSTEMS, AND METHODS FOR STORING ERROR INFORMATION AND PROVIDING RECOMMENDATIONS BASED ON SAME simplified abstract (Micron Technology, Inc.)
- 18617019. VARIABLE PAGE SIZE ARCHITECTURE simplified abstract (Micron Technology, Inc.)
- 18668224. MEMORY DEVICE, TEST METHOD OF THE MEMORY DEVICE, AND METHOD OF MANUFACTURING MEMORY DEVICE INCLUDING THE TEST METHOD (SAMSUNG ELECTRONICS CO., LTD.)
- 18751936. APPARATUS INCLUDING BTI CONTROLLER (Micron Technology, Inc.)
- 18970723. MEMORY AND OPERATION METHOD THEREOF (SK hynix Inc.)
- 18978617. SYSTEM AND MEMORY WITH CONFIGURABLE METADATA PORTION (QUALCOMM Incorporated)
- 18991656. METHOD FOR ERROR CORRECTION CODING WITH MULTIPLE HASH GROUPINGS AND DEVICE FOR PERFORMING THE SAME (Taiwan Semiconductor Manufacturing Company Limited)
G
M
- Micron technology, inc. (20240265991). BIT RETIRING TO MITIGATE BIT ERRORS simplified abstract
- Micron technology, inc. (20240312547). APPARATUSES, SYSTEMS, AND METHODS FOR STORING ERROR INFORMATION AND PROVIDING RECOMMENDATIONS BASED ON SAME simplified abstract
- Micron technology, inc. (20240347088). VARIABLE PAGE SIZE ARCHITECTURE simplified abstract
- Micron technology, inc. (20250104792). APPARATUS INCLUDING BTI CONTROLLER
- Micron Technology, Inc. patent applications on August 8th, 2024
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on March 27th, 2025
- Micron Technology, Inc. patent applications on October 17th, 2024
- Micron Technology, Inc. patent applications on September 19th, 2024
Q
S
- Samsung electronics co., ltd. (20240161850). MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED TO OCCURRENCES OF ERRORS AND OPERATING METHODS OF MEMORY DEVICES simplified abstract
- Samsung electronics co., ltd. (20240257896). MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF
- Samsung electronics co., ltd. (20240257896). MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20240338124). STORAGE DEVICE USING HOST MEMORY BUFFER AND METHOD OF OPERATING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250078947). MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
- Samsung electronics co., ltd. (20250104791). MEMORY DEVICE, TEST METHOD OF THE MEMORY DEVICE, AND METHOD OF MANUFACTURING MEMORY DEVICE INCLUDING THE TEST METHOD
- Samsung Electronics Co., Ltd. patent applications on August 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on March 27th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 27th, 2025
- Samsung Electronics Co., Ltd. patent applications on March 6th, 2025
- Samsung Electronics Co., Ltd. patent applications on May 16th, 2024
- Samsung Electronics Co., Ltd. patent applications on October 10th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on October 10th, 2024
- Sk hynix inc. (20240120014). TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract
- Sk hynix inc. (20240161851). TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPLE MEMORY DEVICES simplified abstract
- Sk hynix inc. (20240161853). SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM PERFORMING ERROR CORRECTION OPERATION simplified abstract
- Sk hynix inc. (20240177791). SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE simplified abstract
- Sk hynix inc. (20240242773). TEST CIRCUIT AND RECEIVING CIRCUIT HAVING TEST FUNCTION simplified abstract
- Sk hynix inc. (20250095769). MEMORY AND OPERATION METHOD THEREOF
- Sk hynix inc. (20250125002). ELECTRONIC SYSTEM RELATED TO DETECTING A RESULT OF A RUPTURE OPERATION
- SK hynix Inc. patent applications on April 11th, 2024
- SK hynix Inc. patent applications on April 17th, 2025
- SK hynix Inc. patent applications on July 18th, 2024
- SK hynix Inc. patent applications on March 20th, 2025
- SK hynix Inc. patent applications on May 16th, 2024
- SK hynix Inc. patent applications on May 30th, 2024