Micron technology, inc. (20250104792). APPARATUS INCLUDING BTI CONTROLLER
APPARATUS INCLUDING BTI CONTROLLER
Organization Name
Inventor(s)
YASUSHI Matsubara of Isehara JP
YOSHINORI Fujiwara of Boise ID US
APPARATUS INCLUDING BTI CONTROLLER
This abstract first appeared for US patent application 20250104792 titled 'APPARATUS INCLUDING BTI CONTROLLER
Original Abstract Submitted
according to one or more embodiments of the disclosure, an apparatus comprises a memory device and a bias temperature instability (bti) controller. the bti controller generates and outputs a command and address signal for memory testing. the command and address signal causes the memory device in the idle state to operate for the testing.