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Category:G01R31/3183
Pages in category "G01R31/3183"
The following 31 pages are in this category, out of 31 total.
1
- 17838298. SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18174647. TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF simplified abstract (SK hynix Inc.)
- 18189859. BUILT-IN SELF-TEST ENHANCEMENTS simplified abstract (QUALCOMM Incorporated)
- 18229965. LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW POWER MODE simplified abstract (ADVANTEST CORPORATION)
- 18304568. FORWARD ERROR CORRECTION (FEC) ENCODED PHYSICAL LAYER TEST PATTERN simplified abstract (Cisco Technology, Inc.)
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18506435. METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRIMMING CIRCUIT simplified abstract (Samsung Electronics Co., Ltd.)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18597499. BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA RECOVERY AND SYSTEM-ON-CHIP INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18607764. SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM simplified abstract (ROHM CO., LTD.)
- 18675048. VERIFICATION OF HARDWARE DESIGN FOR DATA TRANSFORMATION COMPONENT simplified abstract (Imagination Technologies Limited)
- 18744322. PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract (Texas Instruments Incorporated)
- 18973377. 3D TAP & SCAN PORT ARCHITECTURES (TEXAS INSTRUMENTS INCORPORATED)
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- Samsung electronics co., ltd. (20240159827). METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRIMMING CIRCUIT simplified abstract
- Samsung electronics co., ltd. (20240302432). BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA RECOVERY AND SYSTEM-ON-CHIP INCLUDING THE SAME simplified abstract
- Samsung Electronics Co., Ltd. patent applications on May 16th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024
- Sk hynix inc. (20240159828). TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF simplified abstract
- SK hynix Inc. patent applications on May 16th, 2024
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- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on March 14th, 2024
- Texas instruments incorporated (20240337691). PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract
- Texas instruments incorporated (20250102569). 3D TAP & SCAN PORT ARCHITECTURES
- TEXAS INSTRUMENTS INCORPORATED patent applications on March 27th, 2025
- Texas Instruments Incorporated patent applications on October 10th, 2024