18973377. 3D TAP & SCAN PORT ARCHITECTURES (TEXAS INSTRUMENTS INCORPORATED)

3D TAP & SCAN PORT ARCHITECTURES

Organization Name

TEXAS INSTRUMENTS INCORPORATED

Inventor(s)

Lee D. Whetsel of Parker TX US

3D TAP & SCAN PORT ARCHITECTURES

This abstract first appeared for US patent application 18973377 titled '3D TAP & SCAN PORT ARCHITECTURES

Original Abstract Submitted

This disclosure describes die test architectures that can be implemented in a first, middle and last die of a die stack. The die test architectures are mainly the same, but for the exceptions mentioned in this disclosure.