SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM

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SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18607764 titled 'SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM

The semiconductor integrated circuit device described in the patent application includes a pseudo-random pattern generator that produces a pseudo-random pattern. It also features a terminal for externally outputting the output of the pseudo-random pattern generator or an evaluation result of noise tolerance based on the pseudo-random pattern.

The device includes a pseudo-random pattern generator.
The pseudo-random pattern generator outputs a pseudo-random pattern.
There is a terminal for external output of the pseudo-random pattern generator's output or noise tolerance evaluation results.
The evaluation of noise tolerance is based on the pseudo-random pattern.

Potential Applications: - This technology can be used in secure communication systems. - It can be applied in encryption and decryption processes. - The device can find applications in electronic devices requiring noise tolerance evaluation.

Problems Solved: - Provides a reliable method for generating pseudo-random patterns. - Enables the evaluation of noise tolerance in electronic devices. - Enhances security in communication systems.

Benefits: - Improved security in data transmission. - Efficient noise tolerance evaluation. - Enhanced reliability in electronic devices.

Commercial Applications: Title: Secure Communication Systems: Utilizing Pseudo-Random Pattern Generator This technology can be commercialized in industries such as telecommunications, cybersecurity, and electronic manufacturing. It can be integrated into devices to enhance data security and noise tolerance evaluation.

Questions about the technology: 1. How does the pseudo-random pattern generator enhance security in communication systems? 2. What are the specific applications of noise tolerance evaluation in electronic devices?

Original Abstract Submitted

Provided is a semiconductor integrated circuit device including a pseudo-random pattern generator configured to output a pseudo-random pattern, a terminal for externally outputting an output of the pseudo-random pattern generator or an evaluation result of noise tolerance evaluated on the basis of the pseudo-random pattern.