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Category:G01R31/3177
Subcategories
This category has the following 11 subcategories, out of 11 total.
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Pages in category "G01R31/3177"
The following 59 pages are in this category, out of 59 total.
1
- 17851860. TEST CIRCUIT USING CLOCK GATING SCHEME TO HOLD CAPTURE PROCEDURE AND BYPASS MODE, AND INTEGRATED CIRCUIT INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18089546. SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract (Intel Corporation)
- 18152017. BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18159486. INTEGRATED CIRCUIT INCLUDING CONSTANT-0 FLIP FLOPS RECONFIGURED TO PROVIDE OBSERVABLE AND CONTROLLABLE TEST POINTS simplified abstract (QUALCOMM Incorporated)
- 18244994. DYNAMIC VOLTAGE FREQUENCY SCALING TO REDUCE TEST TIME simplified abstract (MEDIATEK INC.)
- 18350512. DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18403623. SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18447955. FLIP FLOP STANDARD CELL simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18524900. INTERPOSER CIRCUIT simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18538692. DEVICE AND METHOD FOR PROVIDING PHYSICALLY UNCLONABLE FUNCTION WITH HIGH RELIABILITY simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18604021. INTEGRATED CIRCUIT, MEMORY DEVICE INCLUDING THE INTEGRATED CIRCUIT, AND METHOD OF OPERATING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18612251. RESET FOR SCAN MODE EXIT FOR DEVICES WITH POWER-ON RESET GENERATION CIRCUITRY simplified abstract (STMicroelectronics International N.V.)
- 18624070. SINGLE "A" LATCH WITH AN ARRAY OF "B" LATCHES simplified abstract (SambaNova Systems, Inc.)
- 18728225. CIRCUIT CONVERSION METHOD, LATCH CIRCUIT, AND C-ELEMENT CIRCUIT (SONY SEMICONDUCTOR SOLUTIONS CORPORATION)
- 18734226. 3D STACKED DIE TEST ARCHITECTURE simplified abstract (Texas Instruments Incorporated)
- 18744322. PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract (Texas Instruments Incorporated)
- 18956830. COMMANDED JTAG TEST ACCESS PORT OPERATIONS (TEXAS INSTRUMENTS INCORPORATED)
- 18968627. BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18973377. 3D TAP & SCAN PORT ARCHITECTURES (TEXAS INSTRUMENTS INCORPORATED)
- 19005804. AT-SPEED TEST ACCESS PORT OPERATIONS (TEXAS INSTRUMENTS INCORPORATED)
H
I
- Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract
- Intel Corporation patent applications on June 27th, 2024
- International business machines corporation (20240329137). STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM simplified abstract
- International Business Machines Corporation patent applications on October 3rd, 2024
Q
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- Samsung electronics co., ltd. (20240201256). DEVICE AND METHOD FOR PROVIDING PHYSICALLY UNCLONABLE FUNCTION WITH HIGH RELIABILITY simplified abstract
- Samsung electronics co., ltd. (20240310437). INTEGRATED CIRCUIT, MEMORY DEVICE INCLUDING THE INTEGRATED CIRCUIT, AND METHOD OF OPERATING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250062752). TEST APPARATUS AND TEST METHOD FOR DETECTING DEFECTS OF ELEMENTS INCLUDED IN INTEGRATED CIRCUIT
- Samsung Electronics Co., Ltd. patent applications on February 20th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 20th, 2025
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on September 19th, 2024
T
- Taiwan semiconductor manufacturing co., ltd. (20240097661). BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD simplified abstract
- Taiwan semiconductor manufacturing co., ltd. (20250096783). BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 20th, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 21st, 2024
- Taiwan semiconductor manufacturing company, ltd. (20240295603). DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on April 25th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on February 29th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on September 5th, 2024
- Texas instruments incorporated (20240319274). 3D STACKED DIE TEST ARCHITECTURE simplified abstract
- Texas instruments incorporated (20240337691). PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract
- Texas instruments incorporated (20240345154). INTEGRATED CIRCUIT DIE TEST ARCHITECTURE simplified abstract
- Texas instruments incorporated (20250085343). COMMANDED JTAG TEST ACCESS PORT OPERATIONS
- Texas instruments incorporated (20250102569). 3D TAP & SCAN PORT ARCHITECTURES
- TEXAS INSTRUMENTS INCORPORATED patent applications on March 13th, 2025
- TEXAS INSTRUMENTS INCORPORATED patent applications on March 27th, 2025
- Texas Instruments Incorporated patent applications on October 10th, 2024
- TEXAS INSTRUMENTS INCORPORATED patent applications on October 17th, 2024
- Texas Instruments Incorporated patent applications on September 26th, 2024