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Category:G01N21/88
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This category has the following 43 subcategories, out of 43 total.
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Pages in category "G01N21/88"
The following 186 pages are in this category, out of 186 total.
1
- 17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17737663. OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 17823806. MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING simplified abstract (Micron Technology, Inc.)
- 17881367. WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD OF INSPECTING WAFER USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17915403. Stacking Inspection Apparatus for Electrode Plate or Unit Cell simplified abstract (LG Energy Solution, Ltd.)
- 17940308. INSPECTION SYSTEM INCLUDING SIDE ILLUMINATION UNIT AND INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18069901. PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE COMPONENTS simplified abstract (QUALCOMM Incorporated)
- 18078392. SYSTEM FOR MONITORING VEHICLE MANUFACTURING PROCESS EMPLOYING PORTABLE VISION SYSTEM AND QUALITY MONITORING SYSTEM simplified abstract (Ford Global Technologies, LLC)
- 18107648. INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18172643. SYSTEMS AND METHODS FOR NON-DESTRUCTIVELY TESTING STATOR WELD QUALITY AND EPOXY THICKNESS simplified abstract (Ford Global Technologies, LLC)
- 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18220491. PROTECTIVE SHEET FIXING JIG AND AUTO VISUAL INSPECTION SYSTEM INCLUDING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18223616. LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18225222. METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND COMPUTER-READABLE STORAGE MEDIUM simplified abstract (CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED)
- 18228807. METHOD OF INSPECTING SEMICONDUCTOR DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18261390. OPTICAL DEVICE simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
- 18271496. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT SUBSTRATE simplified abstract (Hitachi High-Tech Corporation)
- 18275945. INSPECTION DEVICE AND INSPECTION METHOD simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
- 18300019. PRINTED-MATTER INSPECTION SYSTEM AND NON-TRANSITORY COMPUTER READABLE MEDIUM simplified abstract (FUJIFILM Business Innovation Corp.)
- 18317387. SEMICONDUCTOR MEASUREMENT APPARATUS simplified abstract (Samsung Electronics Co., Ltd.)
- 18329804. SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS IN CONCRETE DAM simplified abstract (TSINGHUA UNIVERSITY)
- 18367540. INSPECTION APPARATUS AND METHOD simplified abstract (SAMSUNG DISPLAY CO., LTD.)
- 18381811. METHOD FOR FINDING BLACK SPOTS IN SEPARATOR simplified abstract (SAMSUNG SDI CO., LTD.)
- 18385480. APPARATUS FOR INSPECTING SURFACE OF OBJECT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18405546. MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING simplified abstract (Applied Materials, Inc.)
- 18426428. DRIVE CONDITION MONITORING simplified abstract (ABB Schweiz AG)
- 18438672. LAMINATED BLOCK CORRECTNESS DETERMINING METHOD simplified abstract (TOYOTA BOSHOKU KABUSHIKI KAISHA)
- 18483954. OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING METHOD simplified abstract (NEC Corporation)
- 18493226. SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18493995. OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTION APPARATUS THAT USES THE SAME simplified abstract (Kabushiki Kaisha Toshiba)
- 18514512. OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM simplified abstract (Kabushiki Kaisha Toshiba)
- 18547305. Methods for Analyzing an Electrode Layer of a Battery Cell Using a KI Engine, Training a KI Engine, Producing a Battery Storage Device, and Production Units simplified abstract (Siemens Aktiengesellschaft)
- 18553827. INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
- 18571624. DEFECT INSPECTION DEVICE simplified abstract (HITACHI HIGH-TECH CORPORATION)
- 18579687. SIDE SURFACE INSPECTION DEVICE OF CYLINDRICAL BATTERY simplified abstract (LG ENERGY SOLUTION, LTD.)
- 18586543. ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STORAGE DEVICE, AND ELECTRODE PLATE INSPECTION APPARATUS simplified abstract (Prime Planet Energy & Solutions, Inc.)
- 18606782. INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND PROGRAM simplified abstract (FUJIFILM Corporation)
- 18666299. METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, ELECTRONIC DEVICE, AND COMPUTER-READABLE STORAGE MEDIUM simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)
- 18666862. INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER simplified abstract (Japan Tobacco Inc.)
- 18668433. DIGITAL TWIN TROUBLESHOOTING simplified abstract (Oshkosh Corporation)
- 18673488. METHOD OF OPERATING A PROCESSING APPARATUS simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.)
- 18709996. SURFACE INSPECTION APPARATUS (Hitachi High-Tech Corporation)
- 18712239. MONITORING SYSTEM AND OPERATING METHOD THEREOF (LG Energy Solution, Ltd.)
- 18724681. DETERIORATION ESTIMATION SYSTEM, DETERIORATION ESTIMATION METHOD, AND RECORDING MEDIUM (NEC Corporation)
- 18726310. DIAGNOSIS METHOD, DIAGNOSIS DEVICE, AND PROGRAM (MITSUBISHI HEAVY INDUSTRIES, LTD.)
- 18727570. Illumination Apparatus for Illuminating a Microfluidic Device, Analyzer having an Illumination Apparatus, and Method for Illuminating a Microfluidic Device (Robert Bosch GmbH)
- 18732934. OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY DEVICE AND OPTICAL INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18737698. EMISSION DETECTING CAMERA PLACEMENT PLANNING USING 3D MODELS (Schlumberger Technology Corporation)
- 18745125. APPEARANCE INSPECTION DEVICE, WELDING SYSTEM, AND METHOD FOR APPEARANCE INSPECTION OF A WELD simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
- 18745134. APPEARANCE INSPECTING DEVICE, WELDING SYSTEM, SHAPE DATA CORRECTING METHOD, AND METHOD FOR APPEARANCE INSPECTION OF A WELD simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
- 18751438. ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUDING THE SAME (ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE)
- 18757281. IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM (CANON KABUSHIKI KAISHA)
- 18763751. METHOD FOR CALENDERING AN ELECTRODE TAPE, AND CALENDERING DEVICE (Volkswagen Aktiengesellschaft)
- 18805801. DETECTION SYSTEM AND DETECTION METHOD FOR ELECTRONIC DEVICE (InnoLux Corporation)
- 18882143. DEFECT INSPECTION APPARATUS (Samsung Display Co., Ltd.)
- 18893626. METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE IN METROLOGY (ASML Netherlands B.V.)
- 18962220. METHOD FOR INSPECTING PATTERN DEFECTS (Taiwan Semiconductor Manufacturing Co., Ltd.)
3
A
- AgTech patent applications on 10th Jan 2025
- AgTech patent applications on August 15th, 2024
- AgTech patent applications on January 9th, 2025
- Apple inc. (20240102938). ARTIFACT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS simplified abstract
- Apple inc. (20240102939). LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS simplified abstract
- Apple inc. (20240104777). CAMERA-ALIGNMENT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS simplified abstract
- Apple Inc. patent applications on March 28th, 2024
- Applied materials, inc. (20240248046). MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING simplified abstract
- Applied Materials, Inc. patent applications on January 23rd, 2025
- Applied Materials, Inc. patent applications on July 25th, 2024
- Applied Materials, Inc. patent applications on March 6th, 2025
- AR/VR/XR patent applications on August 8th, 2024
B
- Blockchain patent applications on 22nd Mar 2024
- Blockchain patent applications on February 22nd, 2024
- Blockchain patent applications on February 29th, 2024
- Blockchain patent applications on March 21st, 2024
- Boe technology group co., ltd. (20240288376). CURVED SUBSTRATE BUBBLE DETECTION METHOD AND DETECTION SYSTEM simplified abstract
- Boe technology group co., ltd. (20240304034). METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, ELECTRONIC DEVICE, AND COMPUTER-READABLE STORAGE MEDIUM simplified abstract
- BOE TECHNOLOGY GROUP CO., LTD. patent applications on August 29th, 2024
- BOE TECHNOLOGY GROUP CO., LTD. patent applications on September 12th, 2024
C
- Canon kabushiki kaisha (20250003889). IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM
- CANON KABUSHIKI KAISHA patent applications on January 2nd, 2025
- CANON KABUSHIKI KAISHA patent applications on March 6th, 2025
- Contemporary Amperex Technology (Hong Kong) Limited patent applications on January 30th, 2025
- CURRENT LIGHTING SOLUTIONS, LLC (20240265653). INTEGRATED MANAGEMENT OF SENSITIVE CONTROLLED ENVIRONMENTS AND ITEMS CONTAINED THEREIN simplified abstract
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G
K
- Kabushiki kaisha toshiba (20240319104). OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM simplified abstract
- Kabushiki kaisha toshiba (20240319111). OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTION APPARATUS THAT USES THE SAME simplified abstract
- KABUSHIKI KAISHA TOSHIBA patent applications on February 6th, 2025
- KABUSHIKI KAISHA TOSHIBA patent applications on March 6th, 2025
- Kabushiki Kaisha Toshiba patent applications on September 26th, 2024
L
- Lg energy solution, ltd. (20240264089). Marking System and Marking Method for Identifying Defect of Electrode Sheet simplified abstract
- Lg energy solution, ltd. (20240345000). SIDE SURFACE INSPECTION DEVICE OF CYLINDRICAL BATTERY simplified abstract
- Lg energy solution, ltd. (20240419144). MONITORING SYSTEM AND OPERATING METHOD THEREOF
- LG ENERGY SOLUTION, LTD. patent applications on August 8th, 2024
- LG Energy Solution, Ltd. patent applications on December 19th, 2024
- LG ENERGY SOLUTION, LTD. patent applications on October 17th, 2024
M
N
- Nec corporation (20240134010). OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING METHOD simplified abstract
- Nec corporation (20250067681). DETERIORATION ESTIMATION SYSTEM, DETERIORATION ESTIMATION METHOD, AND RECORDING MEDIUM
- NEC Corporation patent applications on April 25th, 2024
- NEC Corporation patent applications on February 27th, 2025
- Ninox 360 LLC (20240272086). SURFACE INSPECTION SYSTEM AND METHOD simplified abstract
O
- Omni Medsci, Inc. (20240225454). CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE FOR DETECTING ANOMALOUS OCCURRENCES AND IMPROVING PERFORMANCE simplified abstract
- Omni Medsci, Inc. (20240268680). TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS simplified abstract
- Omni Medsci, Inc. (20250009232). TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR
- Omni Medsci, Inc. (20250009233). REMOTE SENSING SYSTEM WITH TIME-OF-FLIGHT SENSOR, ACTIVE ILLUMINATOR AND LIGHT SENSING SYSTEM
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- Panasonic intellectual property management co., ltd. (20240118220). INSPECTION DEVICE AND INSPECTION METHOD simplified abstract
- Panasonic intellectual property management co., ltd. (20240302267). OPTICAL DEVICE simplified abstract
- Panasonic intellectual property management co., ltd. (20240337604). APPEARANCE INSPECTING DEVICE, WELDING SYSTEM, SHAPE DATA CORRECTING METHOD, AND METHOD FOR APPEARANCE INSPECTION OF A WELD simplified abstract
- Panasonic intellectual property management co., ltd. (20240337608). APPEARANCE INSPECTION DEVICE, WELDING SYSTEM, AND METHOD FOR APPEARANCE INSPECTION OF A WELD simplified abstract
- Panasonic Intellectual Property Management Co., Ltd. patent applications on April 11th, 2024
- Panasonic Intellectual Property Management Co., Ltd. patent applications on October 10th, 2024
- Panasonic Intellectual Property Management Co., Ltd. patent applications on September 12th, 2024
- Photogrammetry patent applications on 10th Jan 2025
- Photogrammetry patent applications on 20th Dec 2024
- Photogrammetry patent applications on August 15th, 2024
- Photogrammetry patent applications on December 19th, 2024
- Photogrammetry patent applications on January 9th, 2025
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- Samsung display co., ltd. (20240094135). LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract
- Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract
- Samsung display co., ltd. (20240118217). PROTECTIVE SHEET FIXING JIG AND AUTO VISUAL INSPECTION SYSTEM INCLUDING THE SAME simplified abstract
- Samsung display co., ltd. (20240192142). INSPECTION APPARATUS AND METHOD simplified abstract
- Samsung display co., ltd. (20240201098). OPTICAL INSPECTION SYSTEM AND OPTICAL INSPECTION METHOD simplified abstract
- Samsung display co., ltd. (20240201100). SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING THE SAME simplified abstract
- Samsung display co., ltd. (20240255437). INSPECTION APPARATUS simplified abstract
- Samsung display co., ltd. (20240274047). INSPECTING APPARATUS AND INSPECTING METHOD FOR DISPLAY DEVICE simplified abstract
- Samsung display co., ltd. (20240319110). OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY DEVICE AND OPTICAL INSPECTION METHOD USING THE SAME simplified abstract
- Samsung display co., ltd. (20250085231). DEFECT INSPECTION APPARATUS
- Samsung Display Co., Ltd. patent applications on April 11th, 2024
- SAMSUNG DISPLAY CO., LTD. patent applications on August 15th, 2024
- Samsung Display Co., Ltd. patent applications on August 1st, 2024
- SAMSUNG DISPLAY CO., LTD. patent applications on January 25th, 2024
- SAMSUNG DISPLAY CO., LTD. patent applications on June 13th, 2024
- Samsung Display Co., Ltd. patent applications on June 20th, 2024
- Samsung Display Co., Ltd. patent applications on March 13th, 2025
- Samsung Display Co., Ltd. patent applications on March 21st, 2024
- Samsung Display Co., Ltd. patent applications on March 28th, 2024
- Samsung Display Co., Ltd. patent applications on September 26th, 2024
- Samsung electronics co., ltd. (20240125709). SEMICONDUCTOR MEASUREMENT APPARATUS simplified abstract
- Samsung electronics co., ltd. (20240183796). APPARATUS FOR INSPECTING SURFACE OF OBJECT simplified abstract
- Samsung electronics co., ltd. (20240219315). SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD simplified abstract
- Samsung electronics co., ltd. (20240272089). DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD simplified abstract
- Samsung electronics co., ltd. (20240353350). WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250076204). IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on August 15th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on August 15th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 23rd, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 23rd, 2025
- Samsung Electronics Co., Ltd. patent applications on January 30th, 2025
- Samsung Electronics Co., Ltd. patent applications on July 4th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on July 4th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 6th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 6th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 6th, 2025
- Samsung Electronics Co., Ltd. patent applications on October 24th, 2024
- Sentient Science Corporation (20240293870). SYSTEMS AND METHODS FOR DEFECT DETECTION AND CORRECTION IN ADDITIVE MANUFACTURING PROCESSES simplified abstract
T
- Taiwan semiconductor manufacturing co., ltd. (20240312814). METHOD OF OPERATING A PROCESSING APPARATUS simplified abstract
- Taiwan semiconductor manufacturing co., ltd. (20250093278). METHOD FOR INSPECTING PATTERN DEFECTS
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 20th, 2025
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. patent applications on September 19th, 2024
- Taiwan semiconductor manufacturing company, ltd. (20240255435). SYSTEMS AND METHODS FOR INSPECTING SEMICONDUCTOR DEVICES simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on August 1st, 2024
- Tokyo Electron Limited patent applications on March 6th, 2025
U
- Unknown Organization (20240342804). Multi-Parameter Inspection Apparatus for Monitoring of Manufacturing Parts simplified abstract
- US Patent Application 18126804. METHOD FOR DETECTING PRODUCT FOR DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract
- US Patent Application 18446837. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract
