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Category:G11C7/04
Subcategories
This category has the following 12 subcategories, out of 12 total.
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Pages in category "G11C7/04"
The following 71 pages are in this category, out of 71 total.
1
- 17831114. TRACKING THE EFFECTS OF VOLTAGE AND TEMPERATURE ON A MEMORY DEVICE USING AN INTERNAL OSCILLATOR simplified abstract (Micron Technology, Inc.)
- 17831350. MEMORY BLOCK CHARACTERISTIC DETERMINATION simplified abstract (Micron Technology, Inc.)
- 17856691. ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17962992. RECEIVER RECEIVING MULTI-LEVEL SIGNAL, MEMORY DEVICE INCLUDING THE SAME AND METHOD OF RECEIVING DATA USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18185127. METHOD FOR CONTROLLING TEMPERATURE OF CHIPS AND RELATED CHIPS simplified abstract (Yangtze Memory Technologies Co., LTD.)
- 18204972. STORAGE DEVICES DETECTING INTERNAL TEMPERATURE AND DEFECTS BY USING TEMPERATURE SENSORS AND METHODS OF OPERATING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18230270. OPEN BLOCK DETECTION METHOD USING FOR FIRST AND SECOND TIME PERIOD READ TIME VALLEY FOR NON-VOLATILE MEMORY APPARATUS (Western Digital Technologies, Inc.)
- 18237793. MEMORY DEVICE AND METHOD FOR PERFORMING CACHE PROGRAM ON MEMORY DEVICE simplified abstract (YANGTZE MEMORY TECHNOLOGIES CO., LTD.)
- 18237816. CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 18325109. STORAGE DEVICE AND OPERATING METHOD THEREOF simplified abstract (SK hynix Inc.)
- 18368907. MEMORY DEVICE AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18375805. MEMORY DEVICE INCLUDING VOLTAGE AND TEMPERATURE SENSING CIRCUIT AND METHOD FOR MANAGING OPERATION THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18420053. INFORMATION PROCESSING DEVICE simplified abstract (TOYOTA JIDOSHA KABUSHIKI KAISHA)
- 18448393. TEMPERATURE BASED BLOCK READ simplified abstract (Western Digital Technologies, Inc.)
- 18481786. NON-VOLATILE MEMORY WITH CURRENT DETECTION CIRCUIT (Western Digital Technologies, Inc.)
- 18494768. MEMORY DEVICE FOR PERFORMING CHANNEL PRECHARGE OPERATION AND METHOD FOR OPERATING THE SAME (SK hynix Inc.)
- 18505855. MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract (Micron Technology, Inc.)
- 18539798. MULTI-SAMPLED, CHARGE-SHARING THERMOMETER IN MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18615790. MEMORY DEVICE GENERATING VOLTAGE RESPONSIVE TO TEMPERATURE AND METHOD OF OPERATING THE SAME (SK hynix Inc.)
- 18617019. VARIABLE PAGE SIZE ARCHITECTURE simplified abstract (Micron Technology, Inc.)
- 18651032. APPARATUS WITH POST-MANUFACTURING DATA UPDATE MECHANISM AND METHODS FOR OPERATING THE SAME simplified abstract (Micron Technology, Inc.)
- 18653241. MEMORY SYSTEM simplified abstract (Kioxia Corporation)
- 18659845. MEMORY BLOCK CHARACTERISTIC DETERMINATION simplified abstract (Micron Technology, Inc.)
- 18666874. STORAGE DEVICE FOR SELECTIVELY PERFORMING HIGH-RELIABILITY PROGRAM OPERATION ACCORDING TO TEMPERATURE, AND OPERATION METHOD OF THE STORAGE DEVICE (SAMSUNG ELECTRONICS CO., LTD.)
- 18677727. MEMORY SYSTEM, CONTROL METHOD THEREOF, AND PROGRAM simplified abstract (Kioxia Corporation)
- 18774638. VOLTAGE SCALING BASED ON ERROR RATE FLUCTUATIONS (Micron Technology, Inc.)
- 18999421. DYNAMIC PROCESSING OF STORAGE COMMAND BASED ON INTERNAL OPERATIONS OF STORAGE SYSTEM (Kioxia Corporation)
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- Micron technology, inc. (20240161838). MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract
- Micron technology, inc. (20240203516). SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE simplified abstract
- Micron technology, inc. (20240281151). APPARATUS WITH POST-MANUFACTURING DATA UPDATE MECHANISM AND METHODS FOR OPERATING THE SAME simplified abstract
- Micron technology, inc. (20240290411). TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM simplified abstract
- Micron technology, inc. (20240296892). MEMORY BLOCK CHARACTERISTIC DETERMINATION simplified abstract
- Micron technology, inc. (20240347088). VARIABLE PAGE SIZE ARCHITECTURE simplified abstract
- Micron technology, inc. (20250069679). VOLTAGE SCALING BASED ON ERROR RATE FLUCTUATIONS
- Micron Technology, Inc. patent applications on August 22nd, 2024
- Micron Technology, Inc. patent applications on August 29th, 2024
- Micron Technology, Inc. patent applications on February 13th, 2025
- Micron Technology, Inc. patent applications on February 27th, 2025
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on February 6th, 2025
- Micron Technology, Inc. patent applications on January 18th, 2024
- Micron Technology, Inc. patent applications on January 23rd, 2025
- Micron Technology, Inc. patent applications on June 20th, 2024
- Micron Technology, Inc. patent applications on May 16th, 2024
- Micron Technology, Inc. patent applications on October 17th, 2024
- Micron Technology, Inc. patent applications on September 5th, 2024
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- Samsung electronics co., ltd. (20240242743). MEMORY DEVICE AND OPERATING METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20240274212). VOLTAGE GENERATION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240321324). MEMORY DEVICE INCLUDING VOLTAGE AND TEMPERATURE SENSING CIRCUIT AND METHOD FOR MANAGING OPERATION THEREOF simplified abstract
- Samsung electronics co., ltd. (20250022524). MEMORY DEVICE AND METHOD FOR CALIBRATING IMPEDANCE THEREOF
- Samsung electronics co., ltd. (20250118371). STORAGE DEVICE FOR SELECTIVELY PERFORMING HIGH-RELIABILITY PROGRAM OPERATION ACCORDING TO TEMPERATURE, AND OPERATION METHOD OF THE STORAGE DEVICE
- Samsung Electronics Co., Ltd. patent applications on April 10th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on April 10th, 2025
- Samsung Electronics Co., Ltd. patent applications on August 15th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on August 15th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 15th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 16th, 2025
- Samsung Electronics Co., Ltd. patent applications on July 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 26th, 2024
- Sk hynix inc. (20240420780). MEMORY DEVICE FOR PERFORMING CHANNEL PRECHARGE OPERATION AND METHOD FOR OPERATING THE SAME
- Sk hynix inc. (20250095696). MEMORY DEVICE GENERATING VOLTAGE RESPONSIVE TO TEMPERATURE AND METHOD OF OPERATING THE SAME
- SK hynix Inc. patent applications on December 19th, 2024
- SK hynix Inc. patent applications on March 20th, 2025
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- Taiwan semiconductor manufacturing co., ltd. (20240185895). SYSTEM FOR DIFFERENTIATED THERMAL THROTTLING OF MEMORY AND METHOD OF OPERATING SAME simplified abstract
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on June 6th, 2024
- Toyota jidosha kabushiki kaisha (20240345739). INFORMATION PROCESSING DEVICE simplified abstract
- TOYOTA JIDOSHA KABUSHIKI KAISHA patent applications on October 17th, 2024