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Category:G01B11/30
Subcategories
This category has the following 18 subcategories, out of 18 total.
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Pages in category "G01B11/30"
The following 28 pages are in this category, out of 28 total.
1
- 17586189. OPTICAL MEASUREMENT APPARATUS, MEASURING METHOD USING THE SAME, AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17936608. SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION simplified abstract (Applied Materials, Inc.)
- 18283858. VEHICLE-MOUNTED APPARATUS, CONTROL SERVER, METHOD FOR COLLECTING MEASUREMENT DATA AND PROGRAM RECORDING MEDIUM simplified abstract (NEC Corporation)
- 18401881. DETECTOR FOR PROCESS KIT RING WEAR simplified abstract (Applied Materials, Inc.)
- 18468926. SYSTEM AND METHOD FOR DETERMINING COMPACTION LAYER DEPTH DURING AGRICULTURAL MACHINE OPERATION (CNH Industrial America LLC)
- 18527700. OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18572255. COATING EVALUATION DEVICE AND COATING EVALUATION METHOD simplified abstract (Nissan Motor Co., Ltd.)
- 18679478. WAFER INSPECTION APPARATUS AND METHOD simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18764589. OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, AND METHOD FOR IMAGING OBJECT (KABUSHIKI KAISHA TOSHIBA)
- 18961284. INTRAORAL 3D SCANNER WITH HIGH GAIN FACTOR (Align Technology, Inc.)
- 18974213. SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 19003410. LASER DEVICE AND METHOD OF USING THE SAME (Taiwan Semiconductor Manufacturing Company, Ltd.)
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- Samsung electronics co., ltd. (20240183657). OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD simplified abstract
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 6th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 6th, 2024
- Saudi Arabian Oil Company patent applications on February 13th, 2025
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- Taiwan semiconductor manufacturing co., ltd. (20250100161). SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 27th, 2025
- Taiwan semiconductor manufacturing company, ltd. (20240319109). WAFER INSPECTION APPARATUS AND METHOD simplified abstract
- Taiwan semiconductor manufacturing company, ltd. (20250149844). LASER DEVICE AND METHOD OF USING THE SAME
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on May 8th, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on September 26th, 2024