Samsung electronics co., ltd. (20240183657). OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD simplified abstract
OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD
Organization Name
Inventor(s)
Daisuke Nagatomo of Yokohama (JP)
Shinji Ueyama of Yokohama (JP)
Takamasa Sugiura of Yokohama (JP)
Fumitaka Moroishi of Yokohama (JP)
Masanori Izumita of Yokohama (JP)
Takahiro Tokumiya of Yokohama (JP)
Tatsuya Ishimoto of Yokohama (JP)
Masato Kajinami of Yokohama (JP)
OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240183657 titled 'OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD
Simplified Explanation
The optical device described in the patent application includes a monochromatic light source, a light distribution switching portion, an objective lens, an aperture stop, an imaging lens, a light receiver, and a controller. The device is capable of transmitting monochromatic light in a specific fan-shaped region while blocking it in other regions, collecting reflected light from an object, converting the reflected light into an electrical signal, and calculating the normal direction of the object based on the received signal.
- Monochromatic light source
- Light distribution switching portion
- Objective lens
- Aperture stop
- Imaging lens
- Light receiver
- Controller
Potential Applications
The technology can be applied in fields such as industrial inspection, quality control, medical imaging, and scientific research.
Problems Solved
The device solves the problem of accurately determining the normal direction of an object using reflected light.
Benefits
The optical device offers precise and efficient measurement of object surfaces, leading to improved accuracy in various applications.
Potential Commercial Applications
"Optical Device for Normal Direction Calculation in Industrial Inspection"
Possible Prior Art
There may be similar devices used in fields such as metrology, microscopy, and machine vision systems.
Unanswered Questions
How does the device handle variations in object surface reflectivity?
The patent application does not specify how the device compensates for differences in object reflectivity that may affect the accuracy of normal direction calculations.
What is the maximum range of object sizes that can be accurately measured by the device?
The patent application does not mention the limitations of the device in terms of the size range of objects it can effectively analyze.
Original Abstract Submitted
an optical device includes a monochromatic light source, a light distribution switching portion configured to transmit monochromatic light emitted from the monochromatic light source in one fan-shaped region among a plurality of fan-shaped regions centered on a central optical axis and block the monochromatic light in other fan-shaped regions, an objective lens, an aperture stop configured to collect reflected light from the object, an imaging lens, which has passed through the aperture stop, a light receiver on an imaging plane formed by the imaging lens and configured to receive the reflected light from the object and photoelectrically convert the received reflected light, and a controller configured to instruct the light distribution switching portion to change a region transmitting light over time, and calculate a normal direction of the object based on an electrical signal photoelectrically converted by the light receiver.
- Samsung electronics co., ltd.
- Daisuke Nagatomo of Yokohama (JP)
- Shinji Ueyama of Yokohama (JP)
- Takamasa Sugiura of Yokohama (JP)
- Euisun Choi of Suwon-si (KR)
- Fumitaka Moroishi of Yokohama (JP)
- Masanori Izumita of Yokohama (JP)
- Takahiro Tokumiya of Yokohama (JP)
- Tatsuya Ishimoto of Yokohama (JP)
- Masato Kajinami of Yokohama (JP)
- G01B11/30