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Category:G11C29/14
Subcategories
This category has the following 9 subcategories, out of 9 total.
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Pages in category "G11C29/14"
The following 41 pages are in this category, out of 41 total.
1
- 17954663. SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18093560. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18096407. SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract (SK hynix Inc.)
- 18146558. Memory Verification Using Processing-in-Memory simplified abstract (Advanced Micro Devices, Inc.)
- 18155547. LATCH TYPE SENSE AMPLIFIER FOR TESTING simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18364303. MEMORY DEVICE, MEMORY SYSTEM HAVING THE SAME AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18392740. AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES simplified abstract (Texas Instruments Incorporated)
- 18482300. ERROR CORRECTION CODE CIRCUIT, MEMORY DEVICE INCLUDING ERROR CORRECTION CODE CIRCUIT, AND OPERATION METHOD OF ERROR CORRECTION CODE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18581160. SEMICONDUCTOR DEVICES RELATED TO GENERATION OF INTERNAL COMMMANDS (SK hynix Inc.)
- 18600070. MEMORY SYSTEM, DEBUGGING DEVICE, DEBUGGING METHOD OF MEMORY SYSTEM, AND METHOD OF OPERATING MEMORY SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 18986494. METHOD AND AN APPARATUS FOR DDR5 DIMM POWER FAIL MONITOR TO PREVENT I/O REVERSE-BIAS CURRENT (Intel Corporation)
- 19020347. 3D STACKED INTEGRATED CIRCUITS HAVING FUNCTIONAL BLOCKS CONFIGURED TO PROVIDE REDUNDANCY SITES (Micron Technology, Inc.)
I
M
- Micron technology, inc. (20240185915). OPTIMIZATION OF SOFT BIT WINDOWS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS simplified abstract
- Micron technology, inc. (20240412795). TRACK CHARGE LOSS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS COLLECTED IN CALIBRATION OPERATIONS
- Micron technology, inc. (20240412801). TECHNIQUES FOR DETECTING A STATE OF A BUS
- Micron technology, inc. (20250149531). 3D STACKED INTEGRATED CIRCUITS HAVING FUNCTIONAL BLOCKS CONFIGURED TO PROVIDE REDUNDANCY SITES
- Micron Technology, Inc. patent applications on December 12th, 2024
- Micron Technology, Inc. patent applications on June 6th, 2024
- Micron Technology, Inc. patent applications on May 8th, 2025
S
- Samsung electronics co., ltd. (20240185942). ERROR CORRECTION CODE CIRCUIT, MEMORY DEVICE INCLUDING ERROR CORRECTION CODE CIRCUIT, AND OPERATION METHOD OF ERROR CORRECTION CODE simplified abstract
- Samsung electronics co., ltd. (20240212776). MEMORY DEVICE, MEMORY SYSTEM HAVING THE SAME AND OPERATING METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20240304270). MEMORY SYSTEM, DEBUGGING DEVICE, DEBUGGING METHOD OF MEMORY SYSTEM, AND METHOD OF OPERATING MEMORY SYSTEM simplified abstract
- Samsung electronics co., ltd. (20250078947). MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
- Samsung Electronics Co., Ltd. patent applications on June 27th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 6th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 6th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 6th, 2025
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024
- Sk hynix inc. (20240120015). SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract
- Sk hynix inc. (20240242773). TEST CIRCUIT AND RECEIVING CIRCUIT HAVING TEST FUNCTION simplified abstract
- Sk hynix inc. (20250124999). SEMICONDUCTOR DEVICES RELATED TO GENERATION OF INTERNAL COMMMANDS
- SK hynix Inc. patent applications on April 11th, 2024
- SK hynix Inc. patent applications on April 17th, 2025
- SK hynix Inc. patent applications on July 18th, 2024