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Category:G11C29/10
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This category has the following 7 subcategories, out of 7 total.
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Pages in category "G11C29/10"
The following 46 pages are in this category, out of 46 total.
1
- 17807314. ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17934137. COUNTER MANAGEMENT FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17941592. VIRTUAL AND PHYSICAL EXTENDED MEMORY ARRAY simplified abstract (Micron Technology, Inc.)
- 17943706. BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY simplified abstract (Micron Technology, Inc.)
- 17957808. SIGNAL INTERFERENCE TESTING USING RELIABLE READ WRITE INTERFACE simplified abstract (ADVANCED MICRO DEVICES, INC.)
- 18229981. MEMORY QUEUE OPERATIONS TO INCREASE THROUGHPUT IN AN ATE SYSTEM simplified abstract (ADVANTEST CORPORATION)
- 18392740. AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES simplified abstract (Texas Instruments Incorporated)
- 18420404. Programmable Memory Timing simplified abstract (Micron Technology, Inc.)
- 18451969. MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18475968. BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODULE TESTING METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18501111. DETERMINISTIC TEST PROGRAM GENERATION FOR EVALUATING CACHE COHERENCY (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18525856. MEMORY INCLUDING ERROR CORRECTION CIRCUIT (SK hynix Inc.)
- 18605685. Memory with Scan Chain Testing of Column Redundancy Logic and Multiplexing simplified abstract (QUALCOMM Incorporated)
- 18889273. ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS (Micron Technology, Inc.)
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- Intel corporation (20240404617). RUNTIME ALERT SIGNAL ACTIVATION TEST MODE
- Intel corporation (20240404617). RUNTIME ALERT SIGNAL ACTIVATION TEST MODE simplified abstract
- Intel Corporation patent applications on December 5th, 2024
- International business machines corporation (20250149103). DETERMINISTIC TEST PROGRAM GENERATION FOR EVALUATING CACHE COHERENCY
- INTERNATIONAL BUSINESS MACHINES CORPORATION patent applications on May 8th, 2025
M
- Micron technology, inc. (20240161796). Programmable Memory Timing simplified abstract
- Micron technology, inc. (20250014663). ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS
- Micron Technology, Inc. patent applications on February 6th, 2025
- Micron Technology, Inc. patent applications on January 9th, 2025
- Micron Technology, Inc. patent applications on March 14th, 2024
- Micron Technology, Inc. patent applications on May 16th, 2024
Q
- Qualcomm incorporated (20240221853). Memory with Scan Chain Testing of Column Redundancy Logic and Multiplexing simplified abstract
- QUALCOMM Incorporated patent applications on July 4th, 2024
- Quantum Error Correction patent applications on 11th Apr 2025
- Quantum Error Correction patent applications on April 10th, 2025
S
- Samsung electronics co., ltd. (20240249788). MEMORY DEVICE simplified abstract
- Samsung electronics co., ltd. (20240331774). NONVOLATILE MEMORY DEVICE, STORAGE DEVICE INCLUDING THE SAME, AND METHOD OF TESTING NONVOLATILE MEMORY DEVICE simplified abstract
- Samsung Electronics Co., Ltd. patent applications on January 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on July 25th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on July 25th, 2024
- Samsung Electronics Co., Ltd. patent applications on October 3rd, 2024
- SK hynix Inc. (20250118387). MEMORY INCLUDING ERROR CORRECTION CIRCUIT
- Sk hynix inc. (20250118387). MEMORY INCLUDING ERROR CORRECTION CIRCUIT
- SK hynix Inc. patent applications on April 10th, 2025
T
- Taiwan semiconductor manufacturing company, ltd. (20240412794). SRAM INTERNAL DFT CIRCUIT WITHOUT OUTPUT HOLD DEGRADATION
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on December 12th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on March 14th, 2024