Micron technology, inc. (20250014663). ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS
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ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS
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ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS
This abstract first appeared for US patent application 20250014663 titled 'ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS
Original Abstract Submitted
methods, systems, and apparatuses include receiving, from a host, an error check functionality request for a memory device that stores encoded data. the encoded data is written to a verification portion of memory with at least one intentional error. a read command of the verification portion is initiated in response to the request. an error check functionality indicator is determined based on a result of the read command and a number of intentional errors in the encoded data. the error check functionality indicator corresponding to the number intentional errors in the encoded data is sent to the host.