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Category:G06F30/333
Subcategories
This category has the following 17 subcategories, out of 17 total.
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Pages in category "G06F30/333"
The following 42 pages are in this category, out of 42 total.
1
- 17741860. METHOD OF PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DEVICE AND COMPUTING DEVICE PERFORMING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18089546. SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract (Intel Corporation)
- 18178467. CIRCUIT NOISE DETERMINATION SYSTEM, CIRCUIT NOISE DETERMINATION METHOD, AND CIRCUIT NOISE DETERMINATION PROGRAM simplified abstract (Kioxia Corporation)
- 18187198. MACHINE-LEARNING-BASED INTEGRATED CIRCUIT TEST CASE SELECTION simplified abstract (QUALCOMM Incorporated)
- 18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated)
- 18338471. ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18342183. TIMING CONSTRAINT AUTO-CREATION FOR INTEGRATED CIRCUIT TESTING (International Business Machines Corporation)
- 18426293. METHOD FOR DESIGNING TEST CIRCUIT AND ELECTRONIC DEVICE simplified abstract (HUAWEI TECHNOLOGIES CO., LTD.)
- 18494852. INTEGRATED CHARGE PUMP TESTING CIRCUITS (Western Digital Technologies, Inc.)
- 18510092. INTEGRATED CIRCUIT, APPLICATION PROCESSOR, AND DATA PROCESSING METHOD simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18528501. INTEGRATED CIRCUIT AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18914937. SPATIALLY AWARE LOW POWER TECHNIQUES FOR DESIGN FOR TESTABILITY (Micron Technology, Inc.)
H
I
- Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract
- Intel Corporation patent applications on June 27th, 2024
- International business machines corporation (20240330552). AUTOMATIC VERIFICATION OF HARDWARE CRYPTOGRAPHIC IMPLEMENTATIONS simplified abstract
- International business machines corporation (20240330554). SCAN CHAIN OPTIMIZATION UTILIZING CONSTRAINED SINGLE LINKAGE CLUSTERING simplified abstract
- International business machines corporation (20250005244). TIMING CONSTRAINT AUTO-CREATION FOR INTEGRATED CIRCUIT TESTING
- International Business Machines Corporation patent applications on January 2nd, 2025
- International Business Machines Corporation patent applications on October 3rd, 2024
M
- Micron technology, inc. (20240427974). POWER EMULATION AND ESTIMATION
- Micron technology, inc. (20250148182). SPATIALLY AWARE LOW POWER TECHNIQUES FOR DESIGN FOR TESTABILITY
- Micron Technology, Inc. patent applications on December 26th, 2024
- Micron Technology, Inc. patent applications on May 8th, 2025
Q
- Qualcomm incorporated (20240111934). DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract
- Qualcomm incorporated (20240320408). MACHINE-LEARNING-BASED INTEGRATED CIRCUIT TEST CASE SELECTION simplified abstract
- QUALCOMM Incorporated patent applications on April 4th, 2024
- QUALCOMM Incorporated patent applications on September 26th, 2024
S
- Samsung electronics co., ltd. (20240202410). INTEGRATED CIRCUIT, APPLICATION PROCESSOR, AND DATA PROCESSING METHOD simplified abstract
- Samsung electronics co., ltd. (20240210471). ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE simplified abstract
- Samsung electronics co., ltd. (20240320410). INTEGRATED CIRCUIT AND OPERATING METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20240378360). SEMICONDUCTOR COMPONENT PROVISION SERVER simplified abstract
- Samsung Electronics Co., Ltd. patent applications on February 13th, 2025
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 27th, 2024
- Samsung Electronics Co., Ltd. patent applications on November 14th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 26th, 2024