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Category:G01N21/31
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This category has the following 12 subcategories, out of 12 total.
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Pages in category "G01N21/31"
The following 63 pages are in this category, out of 63 total.
1
- 18054593. ISOTOPIC MONITORING OF RESERVOIR WATER simplified abstract (Saudi Arabian Oil Company)
- 18148785. SPECTROSCOPIC MONITORING SYSTEM FOR A CARBON CAPTURE USE AND STORAGE PIPELINE simplified abstract (Halliburton Energy Services, Inc.)
- 18174367. NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD simplified abstract (KABUSHIKI KAISHA TOSHIBA)
- 18202663. APPARATUS FOR MEASURING RADICAL DENSITY DISTRIBUTION BASED ON LIGHT ABSORPTION AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18276597. INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM simplified abstract (Sony Group Corporation)
- 18292778. METHOD FOR OPERANDO CHARACTERIZATION OF CHEMICAL SPECIES WITHIN A BATTERY USING INFRARED EVANESCENT WAVE SPECTROSCOPY (CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE)
- 18300252. APPARATUS AND METHOD FOR SENSING GAS AND PARTICULATE MATTER USING AN OPTICAL BEAM simplified abstract (HONEYWELL INTERNATIONAL INC.)
- 18389451. CLOTHES CARE APPARATUS AND CONTROL METHOD THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18404762. INSPECTION SYSTEM WITH MULTIWAVELENGTH LIGHT SOURCE AND METHOD (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18415717. SPECTRAL IMAGE ANALYSIS METHOD, SPECTRAL IMAGE ANALYSIS PROGRAM, AND SPECTRAL IMAGE ANALYSIS DEVICE simplified abstract (SEIKO EPSON CORPORATION)
- 18465992. INSPECTION TOOL AND INSPECTION METHOD simplified abstract (FUJIFILM Corporation)
- 18522404. ANALYSIS APPARATUS simplified abstract (SHIMADZU CORPORATION)
- 18526423. SUBSTRATE MEASUREMENT METHOD AND SUBSTRATE MEASUREMENT CONTROL APPARATUS simplified abstract (SEMES CO., LTD.)
- 18571281. ANALYSIS METHOD AND ANALYSIS DEVICE simplified abstract (HITACHI HIGH-TECH CORPORATION)
- 18607867. System and Method for Quantum Absorption Spectroscopy simplified abstract (SHIMADZU CORPORATION)
- 18611916. OPTICAL DEVICE, SPECTROSCOPIC DEVICE, AND SPECTROSCOPIC METHOD simplified abstract (SEIKO EPSON CORPORATION)
- 18745709. METHOD OF DETERMINING SATURATES, AROMATICS, RESINS, AND ASPHALTENE (SARA) FRACTIONS OF RESERVOIR FLUID DURING DOWNHOLE FLUID ANALYSIS (Schlumberger Technology Corporation)
- 18761798. DETECTION DEVICE (Japan Display Inc.)
- 18763030. DETECTION DEVICE (Japan Display Inc.)
- 18882459. METHODS, APPARATUSES, AND SYSTEMS FOR DIAGNOSING MISALIGNMENT IN GAS DETECTING DEVICES (HONEYWELL INTERNATIONAL INC.)
2
- 20240011898. METHODS AND ASSEMBLIES FOR DETERMINING AND USING STANDARDIZED SPECTRAL RESPONSES FOR CALIBRATION OF SPECTROSCOPIC ANALYZERS simplified abstract (MARATHON PETROLEUM COMPANY LP)
- 20240027354. SPECTROPHOTOMETRIC SYSTEM AND METHOD FOR WIRELESS WATER QUALITY MANAGEMENT OF AQUACULTURE BASIN simplified abstract (RYNAN TECHNOLOGIES PTE. LTD.)
- 20240053259. OPTICAL SYSTEM COMPRISING ANS OPTICAL MULTIPLEXER simplified abstract (X-RITE EUROPE GMBH)
- 20240085315.CLOTHES CARE APPARATUS AND CONTROL METHOD THEREOF simplified abstract (samsung electronics co., ltd.)
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- SafeNet International LLC (20250012714). Hyperspectral Sensing System and Method for Tracing/Tracking Refined Oil Products
- Samsung electronics co., ltd. (20240159657). APPARATUS FOR MEASURING RADICAL DENSITY DISTRIBUTION BASED ON LIGHT ABSORPTION AND OPERATING METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20240255439). DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD simplified abstract
- Samsung Electronics Co., Ltd. patent applications on August 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on January 23rd, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 23rd, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 14th, 2024
- Samsung Electronics Co., Ltd. patent applications on May 16th, 2024
- Schlumberger technology corporation (20240418698). METHOD OF DETERMINING SATURATES, AROMATICS, RESINS, AND ASPHALTENE (SARA) FRACTIONS OF RESERVOIR FLUID DURING DOWNHOLE FLUID ANALYSIS
- Schlumberger Technology Corporation patent applications on December 19th, 2024
- Seiko epson corporation (20240241051). SPECTROSCOPIC MEASUREMENT METHOD, SPECTROMETER, AND SPECTROSCOPIC MEASUREMENT PROGRAM simplified abstract
- Seiko epson corporation (20240248026). SPECTRAL IMAGE ANALYSIS METHOD, SPECTRAL IMAGE ANALYSIS PROGRAM, AND SPECTRAL IMAGE ANALYSIS DEVICE simplified abstract
- Seiko epson corporation (20240288362). Optical Device And Spectroscopic Device simplified abstract
- Seiko epson corporation (20240319082). OPTICAL DEVICE, SPECTROSCOPIC DEVICE, AND SPECTROSCOPIC METHOD simplified abstract
- SEIKO EPSON CORPORATION patent applications on August 29th, 2024
- SEIKO EPSON CORPORATION patent applications on July 18th, 2024
- SEIKO EPSON CORPORATION patent applications on July 25th, 2024
- SEIKO EPSON CORPORATION patent applications on September 26th, 2024
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- Taiwan semiconductor manufacturing co., ltd. (20250085215). INSPECTION SYSTEM WITH MULTIWAVELENGTH LIGHT SOURCE AND METHOD
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 13th, 2025
- Tokyo electron limited (20240241042). SUBSTRATE PROCESSING DEVICE AND METHOD FOR MEASURING PROCESS GAS TEMPERATURE AND CONCENTRATION simplified abstract
- Tokyo Electron Limited patent applications on July 18th, 2024
