Category:Shang-Chieh Chien of Hsinchu (TW)
Shang-Chieh Chien
Shang-Chieh Chien from Hsinchu (TW) has applied for patents in technology areas such as G01N21/31, G01N21/95 with taiwan semiconductor manufacturing co., ltd..
Patents
Pages in category "Shang-Chieh Chien of Hsinchu (TW)"
The following 10 pages are in this category, out of 10 total.
1
- 17461744. LITHOGRAPHY CONTAMINATION CONTROL simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18404762. INSPECTION SYSTEM WITH MULTIWAVELENGTH LIGHT SOURCE AND METHOD (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18446400. LITHOGRAPHY SYSTEM AND METHODS simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
T
- Taiwan semiconductor manufacturing co., ltd. (20250085215). INSPECTION SYSTEM WITH MULTIWAVELENGTH LIGHT SOURCE AND METHOD
- Taiwan semiconductor manufacturing company, ltd. (20240377752). SYSTEM AND METHOD FOR MONITORING AND CONTROLLING EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY PROCESSES simplified abstract
- Taiwan semiconductor manufacturing company, ltd. (20240377764). SYSTEM AND METHOD FOR DETECTING DEBRIS IN A PHOTOLITHOGRAPHY SYSTEM simplified abstract
U
- US Patent Application 17747939. LITHOGRAPHY SYSTEM AND METHODS simplified abstract
- US Patent Application 17750151. SYSTEM AND METHOD FOR DETECTING DEBRIS IN A PHOTOLITHOGRAPHY SYSTEM simplified abstract
- US Patent Application 18361254. SYSTEM AND METHOD FOR PERFORMING EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY PROCESSES simplified abstract
- US Patent Application 18366092. EUV PHOTOLITHOGRAPHY SYSTEM FUEL SOURCE AND METHODS OF OPERATING THE SAME simplified abstract