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Category:G01N21/21
Subcategories
This category has the following 23 subcategories, out of 23 total.
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Pages in category "G01N21/21"
The following 34 pages are in this category, out of 34 total.
1
- 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17967228. ELLIPSOMETER AND APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE INCLUDING THE ELLIPSOMETER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18046601. CHIRAL SENSING WITH HARMONIC GENERATION FROM A METASURFACE FABRICATED ON A SOI WAFER simplified abstract (TOYOTA JIDOSHA KABUSHIKI KAISHA)
- 18100679. EMITTER ARRAY FOR A LUNAR ROVER simplified abstract (GM Global Technology Operations LLC)
- 18154990. SEMICONDUCTOR MEASUREMENT APPARATUS simplified abstract (Samsung Electronics Co., Ltd.)
- 18194909. IMAGING ELLIPSOMETER AND METHOD OF MEASURING AN OVERLAY ERROR USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18539069. FILM THICKNESS MEASUREMENT DEVICE (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)
- 18664157. AIR QUALITY MEASURING DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18732934. OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY DEVICE AND OPTICAL INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18919048. SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING (KLA Corporation)
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- Samsung display co., ltd. (20240319110). OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY DEVICE AND OPTICAL INSPECTION METHOD USING THE SAME simplified abstract
- Samsung Display Co., Ltd. patent applications on September 26th, 2024
- Samsung electronics co., ltd. (20240302268). AIR QUALITY MEASURING DEVICE simplified abstract
- Samsung electronics co., ltd. (20240353350). WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250076204). IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME
- Samsung Electronics Co., Ltd. patent applications on February 13th, 2025
- Samsung Electronics Co., Ltd. patent applications on January 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 6th, 2025
- Samsung Electronics Co., Ltd. patent applications on October 24th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024
- Sony group corporation (20240241040). INSPECTION APPARATUS AND INSPECTION METHOD simplified abstract
- Sony Group Corporation patent applications on July 18th, 2024