Pages that link to "Category:Younghoon Sohn of Suwon-si (KR)"
The following pages link to Category:Younghoon Sohn of Suwon-si (KR):
Displaying 12 items.
- US Patent Application 18097924. INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY DEVICE USING THE SAME simplified abstract (â links)
- 18118816. DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) (â links)
- Samsung electronics co., ltd. (20240230528). TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD simplified abstract (â links)
- 18389028. TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD simplified abstract (Samsung Electronics Co., Ltd.) (â links)
- Samsung electronics co., ltd. (20240241067). APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVICE USING X-RAY DIFFRACTION simplified abstract (â links)
- 18460675. APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVICE USING X-RAY DIFFRACTION simplified abstract (Samsung Electronics Co., Ltd.) (â links)
- Samsung electronics co., ltd. (20240255274). COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME simplified abstract (â links)
- Samsung electronics co., ltd. (20240255439). DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD simplified abstract (â links)
- Samsung electronics co., ltd. (20240295490). MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME simplified abstract (â links)
- 18237589. MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) (â links)
- 18639332. MATERIAL MEASUREMENT SYSTEM AND METHOD (SAMSUNG ELECTRONICS CO., LTD.) (â links)
- Samsung electronics co., ltd. (20250076116). OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND IMAGING MEASUREMENT METHOD USING THE SAME (â links)