Category:Younghoon Sohn of Suwon-si (KR)
Younghoon Sohn
Younghoon Sohn from Suwon-si (KR) has applied for patents in technology areas such as G01J3/28, G01J3/02 with samsung electronics co., ltd..
Patents
Pages in category "Younghoon Sohn of Suwon-si (KR)"
The following 11 pages are in this category, out of 11 total.
1
- 18118816. DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18237589. MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18389028. TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18460675. APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVICE USING X-RAY DIFFRACTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18639332. MATERIAL MEASUREMENT SYSTEM AND METHOD (SAMSUNG ELECTRONICS CO., LTD.)
S
- Samsung electronics co., ltd. (20240230528). TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD simplified abstract
- Samsung electronics co., ltd. (20240241067). APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVICE USING X-RAY DIFFRACTION simplified abstract
- Samsung electronics co., ltd. (20240255274). COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240255439). DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD simplified abstract
- Samsung electronics co., ltd. (20240295490). MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250076116). OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND IMAGING MEASUREMENT METHOD USING THE SAME