Category:James Fitzpatrick of Laguna Niguel CA (US)
James Fitzpatrick of Laguna Niguel CA (US)
Executive Summary
James Fitzpatrick of Laguna Niguel CA (US) is an inventor who has filed 7 patents. Their primary areas of innovation include {Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]} (6 patents), {Management of blocks} (3 patents), {Command handling arrangements, e.g. command buffers, queues, command scheduling} (3 patents), and they have worked with companies such as Micron Technology, Inc. (6 patents), MICRON TECHNOLOGY, INC. (1 patents). Their most frequent collaborators include (4 collaborations), (3 collaborations), (2 collaborations).
Patent Filing Activity
Technology Areas
List of Technology Areas
- G06F3/0679 ({Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]}): 6 patents
- G06F3/064 ({Management of blocks}): 3 patents
- G06F3/0659 ({Command handling arrangements, e.g. command buffers, queues, command scheduling}): 3 patents
- G06F3/0604 (Digital input from, or digital output to, record carriers {, e.g. RAID, emulated record carriers or networked record carriers}): 2 patents
- G06F3/0616 ({in relation to life time, e.g. increasing Mean Time Between Failures [MTBF]}): 2 patents
- G06F3/0611 ({in relation to response time}): 1 patents
- G11C16/3459 ({Circuits or methods to verify correct programming of nonvolatile memory cells}): 1 patents
- G11C29/52 (STATIC STORES (semiconductor memory devices): 1 patents
- G06F3/061 (Digital input from, or digital output to, record carriers {, e.g. RAID, emulated record carriers or networked record carriers}): 1 patents
- G06F3/0655 ({Replication mechanisms}): 1 patents
- G06F11/1044 ({with specific ECC/EDC distribution}): 1 patents
- G06F3/0644 ({Management of space entities, e.g. partitions, extents, pools}): 1 patents
Companies
List of Companies
- Micron Technology, Inc.: 6 patents
- MICRON TECHNOLOGY, INC.: 1 patents
Collaborators
- Dung Viet Nguyen of San Jose CA (US) (4 collaborations)
- Phong S. Nguyen of Livermore CA (US) (3 collaborations)
- Jeffrey S. McNeil of Nampa ID (US) (2 collaborations)
- Sivagnanam Parthasarathy of Carlsbad CA (US) (2 collaborations)
- Kishore Kumar Muchherla of Fremont CA (US) (2 collaborations)
- Violante Moschiano (2 collaborations)
- Huai-Yuan Tseng of San Ramon CA (US) (2 collaborations)
- Patrick R. Khayat of San Diego CA (US) (1 collaborations)
- Sead Zildzic of Rancho Cordova CA (US) (1 collaborations)
- Jeremy Binfet of Boise ID (US) (1 collaborations)
- Kishore Kumar Muccherla of San Jose CA (US) (1 collaborations)
- Phong Sy Nguyen of Livermore CA (US) (1 collaborations)
- Dung V. Nguyen of San Jose CA (US) (1 collaborations)
- Dave Scott Ebsen of Minnetonka MN (US) (1 collaborations)
- Tomoharu Tanaka (1 collaborations)
- Akira Goda (1 collaborations)
- Eric N. Lee of San Jose CA (US) (1 collaborations)
- Steven Raymond Brown of Boise ID (US) (1 collaborations)
Subcategories
This category has the following 8 subcategories, out of 8 total.
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Pages in category "James Fitzpatrick of Laguna Niguel CA (US)"
The following 28 pages are in this category, out of 28 total.
1
- 17830166. MANAGING QUAD-LEVEL CELL COMPACTION STRATEGY OF A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17859468. MEMORY COMPACTION MANAGEMENT IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17897869. ADJUSTMENT OF CODE RATE AS FUNCTION OF MEMORY ENDURANCE STATE METRIC simplified abstract (Micron Technology, Inc.)
- 17899409. TWO-PASS CORRECTIVE PROGRAMMING FOR MEMORY CELLS THAT STORE MULTIPLE BITS AND POWER LOSS MANAGEMENT FOR TWO-PASS CORRECTIVE PROGRAMMING simplified abstract (Micron Technology, Inc.)
- 17941831. ADAPTIVE PRE-READ MANAGEMENT IN MULTI-PASS PROGRAMMING simplified abstract (Micron Technology, Inc.)
- 18198623. GENERATING SEMI-SOFT BIT DATA DURING CORRECTIVE READ OPERATIONS IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 18432326. MEMORY COMPACTION MANAGEMENT IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 18482644. Management of Programming Mode Transitions to Accommodate a Constant Size of Data Transfer between a Host System and a Memory Sub-System simplified abstract (Micron Technology, Inc.)
- 18511698. MULTI-LAYER CODE RATE ARCHITECTURE FOR COPYBACK BETWEEN PARTITIONS WITH DIFFERENT CODE RATES simplified abstract (Micron Technology, Inc.)
- 18611450. ADJUSTMENT OF CODE RATE AS FUNCTION OF MEMORY ENDURANCE STATE METRIC simplified abstract (Micron Technology, Inc.)
- 18612028. MEMORY DEVICE PROGRAMMING TECHNIQUE FOR INCREASED BITS PER CELL simplified abstract (Micron Technology, Inc.)
- 18657672. READ DISTURB MITIGATION BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS COLLECTED FOR READ CALIBRATION simplified abstract (Micron Technology, Inc.)
- 18668021. ONE-LADDER READ OF MEMORY CELLS COARSELY PROGRAMMED VIA INTERLEAVED TWO-PASS DATA PROGRAMMING TECHNIQUES simplified abstract (Micron Technology, Inc.)
- 18678949. Classification of Error Rate of Data Retrieved from Memory Cells simplified abstract (Micron Technology, Inc.)
- 18747234. DATA PROTECTION WITH TIME-VARYING IN-SITU DATA REFRESH (Micron Technology, Inc.)
- 18895273. QUICK CHARGE LOSS MITIGATION USING TWO-PASS CONTROLLED DELAY (Micron Technology, Inc.)
M
- Micron technology, inc. (20240176698). MEMORY COMPACTION MANAGEMENT IN MEMORY DEVICES simplified abstract
- Micron technology, inc. (20240185915). OPTIMIZATION OF SOFT BIT WINDOWS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS simplified abstract
- Micron technology, inc. (20240231617). MEMORY DEVICE PROGRAMMING TECHNIQUE FOR INCREASED BITS PER CELL simplified abstract
- Micron technology, inc. (20240232013). ADJUSTMENT OF CODE RATE AS FUNCTION OF MEMORY ENDURANCE STATE METRIC simplified abstract
- Micron technology, inc. (20240265979). Selective and Dynamic Deployment of Error Correction Code Techniques in Integrated Circuit Memory Devices simplified abstract
- Micron technology, inc. (20240289218). TOUCHUP FOR MEMORY DEVICE USING EMBEDDED ENCODER/DECODER simplified abstract
- Micron technology, inc. (20240296896). READ DISTURB MITIGATION BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS COLLECTED FOR READ CALIBRATION simplified abstract
- Micron technology, inc. (20240304250). ONE-LADDER READ OF MEMORY CELLS COARSELY PROGRAMMED VIA INTERLEAVED TWO-PASS DATA PROGRAMMING TECHNIQUES simplified abstract
- Micron technology, inc. (20240312530). Classification of Error Rate of Data Retrieved from Memory Cells simplified abstract
- Micron technology, inc. (20240412792). SIMPLIFIED OPERATIONS TO READ MEMORY CELLS COARSELY PROGRAMMED VIA INTERLEAVED TWO-PASS DATA PROGRAMMING TECHNIQUES
- Micron technology, inc. (20240412795). TRACK CHARGE LOSS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS COLLECTED IN CALIBRATION OPERATIONS
- Dung Viet Nguyen of San Jose CA (US)
- Phong S. Nguyen of Livermore CA (US)
- Jeffrey S. McNeil of Nampa ID (US)
- Sivagnanam Parthasarathy of Carlsbad CA (US)
- Kishore Kumar Muchherla of Fremont CA (US)
- Violante Moschiano
- Huai-Yuan Tseng of San Ramon CA (US)
- Patrick R. Khayat of San Diego CA (US)
- Sead Zildzic of Rancho Cordova CA (US)
- Jeremy Binfet of Boise ID (US)
- Kishore Kumar Muccherla of San Jose CA (US)
- Phong Sy Nguyen of Livermore CA (US)
- Dung V. Nguyen of San Jose CA (US)
- Dave Scott Ebsen of Minnetonka MN (US)
- Tomoharu Tanaka
- Akira Goda
- Eric N. Lee of San Jose CA (US)
- Steven Raymond Brown of Boise ID (US)
- James Fitzpatrick of Laguna Niguel CA (US)
- Inventors
- Inventors filing patents with Micron Technology, Inc.
- Inventors filing patents with MICRON TECHNOLOGY, INC.