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Category:G11C29/18
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Pages in category "G11C29/18"
The following 21 pages are in this category, out of 21 total.
1
- 17697240. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17823450. Dynamic Address Scramble simplified abstract (Micron Technology, Inc.)
- 18062843. MEMORY DEVICE FOR OUTPUTTING TEST RESULTS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18068337. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18093560. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18100969. TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18101123. SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM PERFORMING ERROR CORRECTION OPERATION simplified abstract (SK hynix Inc.)
- 18116019. TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPLE MEMORY DEVICES simplified abstract (SK hynix Inc.)
- 18320088. SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE simplified abstract (SK hynix Inc.)
- 18362130. MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED TO OCCURRENCES OF ERRORS AND OPERATING METHODS OF MEMORY DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
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- Samsung electronics co., ltd. (20240161850). MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED TO OCCURRENCES OF ERRORS AND OPERATING METHODS OF MEMORY DEVICES simplified abstract
- Samsung Electronics Co., Ltd. patent applications on May 16th, 2024
- Sk hynix inc. (20240120014). TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract
- Sk hynix inc. (20240161851). TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPLE MEMORY DEVICES simplified abstract
- Sk hynix inc. (20240161853). SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM PERFORMING ERROR CORRECTION OPERATION simplified abstract
- Sk hynix inc. (20240177791). SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024
- SK hynix Inc. patent applications on May 16th, 2024
- SK hynix Inc. patent applications on May 30th, 2024