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Category:Sandeep Jain of Noida IN

From WikiPatents

Sandeep Jain

Sandeep Jain from Noida IN has applied for patents in technology areas such as G01R31/319, G01R31/317, G01R31/3193 with stmicroelectronics international n.v..

Patents

TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS (20250102574)

Pages in category "Sandeep Jain of Noida IN"

The following 2 pages are in this category, out of 2 total.

1

18474511. TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS (STMicroelectronics International N.V.)

S

Stmicroelectronics international n.v. (20250102574). TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS

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