Latest revision as of 17:08, 24 May 2025

Younghoon Sohn

Younghoon Sohn from Suwon-si KR has applied for patents in technology areas such as [[:Category:{for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions (electrical measurement of diffusions )}|{for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions (electrical measurement of diffusions )}]] with Samsung Electronics Co., Ltd..

Patents

ELECTRONIC DEVICE FOR PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DEVICE AND OPERATING METHOD OF ELECTRONIC DEVICE (20250167051)

[[Category:{for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions (electrical measurement of diffusions )}]]

Pages in category "Younghoon Sohn of Suwon-si KR"

The following 8 pages are in this category, out of 8 total.

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20250167051. Electronic Devic (Samsung Electronics ., .)

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 = Younghoon Sohn =
-Younghoon Sohn from Suwon-si KR has applied for patents in technology areas such as [[:Category:G01B11/06|G01B11/06]] with [[:Category:samsung electronics co., ltd.|samsung electronics co., ltd.]].
+Younghoon Sohn from Suwon-si  KR has applied for patents in technology areas such as [[:Category:{for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions  (electrical measurement of diffusions )}|{for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions  (electrical measurement of diffusions )}]] with [[:Category:Samsung Electronics Co., Ltd.|Samsung Electronics Co., Ltd.]].
 == Patents ==
-* [[samsung electronics co., ltd. (20250003734). MATERIAL MEASUREMENT SYSTEM AND METHOD|MATERIAL MEASUREMENT SYSTEM AND METHOD (20250003734)]]
+* [[20250167051. ELECTRONIC DEVICE FOR PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DEVICE AND OPERATING METHOD OF ELECTRONIC DEVICE (Samsung Electronics Co., Ltd.)|ELECTRONIC DEVICE FOR PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DEVICE AND OPERATING METHOD OF ELECTRONIC DEVICE (20250167051)]]
 [[Category:Inventors]]
-[[Category:samsung electronics co., ltd.]]
+[[Category:Samsung Electronics Co., Ltd.]]
-[[Category:G01B11/06]]
+[[Category:{for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions  (electrical measurement of diffusions )}]]