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Category:G03F9/00
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This category has the following 11 subcategories, out of 11 total.
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Pages in category "G03F9/00"
The following 66 pages are in this category, out of 66 total.
1
- 17383849. METHOD FOR CALIBRATING ALIGNMENT OF WAFER AND LITHOGRAPHY SYSTEM simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17847111. TECHNOLOGIES FOR OVERLAY METROLOGY MARKS simplified abstract (Intel Corporation)
- 17933968. ALIGNMENT-OVERLAY MARK AND METHOD USING THE SAME simplified abstract (Micron Technology, Inc.)
- 18062080. MEASUREMENT APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD simplified abstract (CANON KABUSHIKI KAISHA)
- 18064158. METHOD AND APPARATUS FOR IDENTIFYING POSITIONS OF A SPATIAL LIGHT MODULATOR RELATIVE TO A TEMPLATE EDGE simplified abstract (CANON KABUSHIKI KAISHA)
- 18153242. INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD simplified abstract (CANON KABUSHIKI KAISHA)
- 18354078. IMPRINTING METHOD, IMPRINT APPARATUS AND ARTICLE MANUFACTURING METHOD simplified abstract (CANON KABUSHIKI KAISHA)
- 18411581. PATTERN CORRECTION DEVICE, PATTERN CORRECTION METHOD, AND PATTERN FORMATION METHOD FOR SEMICONDUCTOR DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18413910. METROLOGY METHOD AND APPARATUS simplified abstract (ASML NETHERLANDS B.V.)
- 18421399. PHOTOLITHOGRAPHY METHOD AND STRUCTURES THEREOF (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18449779. DETECTION DEVICE, DETECTION METHOD, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD simplified abstract (CANON KABUSHIKI KAISHA)
- 18457983. PATTERN FORMATION METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND IMPRINT APPARATUS simplified abstract (Kioxia Corporation)
- 18467389. METHOD FOR FORMING SEMICONDUCTOR DIE (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18492587. INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD simplified abstract (CANON KABUSHIKI KAISHA)
- 18508566. METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18523745. IMPRINT APPARATUS, ARTICLE MANUFACTURING METHOD, DETERMINATION METHOD, AND RECORDING MEDIUM simplified abstract (CANON KABUSHIKI KAISHA)
- 18542946. CONTROL APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD simplified abstract (CANON KABUSHIKI KAISHA)
- 18736947. ALIGNMENT MARK STRUCTURE AND METHOD FOR MAKING simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18744367. METHOD OF GENERATING A SAMPLE MAP, COMPUTER PROGRAM PRODUCT, CHARGED PARTICLE INSPECTION SYSTEM, METHOD OF PROCESSING A SAMPLE, ASSESSMENT METHOD simplified abstract (ASML Netherlands B.V.)
- 18810734. POSITION MEASURING METHOD, METHOD FOR MANUFACTURING ARTICLE, POSITION MEASURING APPARATUS, SEMICONDUCTOR MANUFACTURING APPARATUS, AND IMPRINT APPARATUS (CANON KABUSHIKI KAISHA)
2
- 20240027919. MASSIVE OVERLAY METROLOGY SAMPLING WITH MULTIPLE MEASUREMENT COLUMNS simplified abstract (KLA Corporation)
- 20240036480. A SUBSTRATE COMPRISING A TARGET ARRANGEMENT, AND ASSOCIATED AT LEAST ONE PATTERNING DEVICE, LITHOGRAPHIC METHOD AND METROLOGY METHOD simplified abstract (ASML NETHERLANDS B.V.)
B
C
- Canon kabushiki kaisha (20240176231). IMPRINT APPARATUS, ARTICLE MANUFACTURING METHOD, DETERMINATION METHOD, AND RECORDING MEDIUM simplified abstract
- Canon kabushiki kaisha (20240192612). METHOD AND APPARATUS FOR IDENTIFYING POSITIONS OF A SPATIAL LIGHT MODULATOR RELATIVE TO A TEMPLATE EDGE simplified abstract
- Canon kabushiki kaisha (20240210843). CONTROL APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD simplified abstract
- Canon kabushiki kaisha (20240264529). INFORMATION PROCESSING METHOD FOR DECIDING ARRANGEMENT OF DROPLETS IN FILM FORMATION simplified abstract
- Canon kabushiki kaisha (20240288780). INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD simplified abstract
- Canon kabushiki kaisha (20240288787). MEASURING METHOD OF MEASURING SUBSTRATE BY CAPTURING IMAGES OF MARKS THEREON simplified abstract
- Canon kabushiki kaisha (20240288845). INFORMATION PROCESSING APPARATUS AND STORAGE MEDIUM simplified abstract
- Canon kabushiki kaisha (20250085645). POSITION MEASURING METHOD, METHOD FOR MANUFACTURING ARTICLE, POSITION MEASURING APPARATUS, SEMICONDUCTOR MANUFACTURING APPARATUS, AND IMPRINT APPARATUS
- CANON KABUSHIKI KAISHA patent applications on August 29th, 2024
- CANON KABUSHIKI KAISHA patent applications on August 8th, 2024
- CANON KABUSHIKI KAISHA patent applications on February 15th, 2024
- CANON KABUSHIKI KAISHA patent applications on February 29th, 2024
- CANON KABUSHIKI KAISHA patent applications on February 6th, 2025
- CANON KABUSHIKI KAISHA patent applications on February 8th, 2024
- CANON KABUSHIKI KAISHA patent applications on January 25th, 2024
- CANON KABUSHIKI KAISHA patent applications on January 30th, 2025
- CANON KABUSHIKI KAISHA patent applications on June 13th, 2024
- CANON KABUSHIKI KAISHA patent applications on June 27th, 2024
- CANON KABUSHIKI KAISHA patent applications on March 13th, 2025
- CANON KABUSHIKI KAISHA patent applications on March 6th, 2025
- CANON KABUSHIKI KAISHA patent applications on May 30th, 2024
K
S
- Samsung electronics co., ltd. (20240203796). METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract
- Samsung electronics co., ltd. (20240302758). PATTERN CORRECTION DEVICE, PATTERN CORRECTION METHOD, AND PATTERN FORMATION METHOD FOR SEMICONDUCTOR DEVICES simplified abstract
- Samsung electronics co., ltd. (20250060685). WAFER ALIGNMENT SYSTEM AND WAFER ALIGNMENT METHOD
- Samsung Electronics Co., Ltd. patent applications on February 20th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 20th, 2025
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024
T
- Taiwan semiconductor manufacturing co., ltd. (20250095987). METHOD FOR FORMING SEMICONDUCTOR DIE
- Taiwan semiconductor manufacturing co., ltd. (20250096146). PHOTOLITHOGRAPHY METHOD AND STRUCTURES THEREOF
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 20th, 2025
- Taiwan semiconductor manufacturing company, ltd. (20240321767). ALIGNMENT MARK STRUCTURE AND METHOD FOR MAKING simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on September 26th, 2024
