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Category:G01R31/3187
Pages in category "G01R31/3187"
The following 21 pages are in this category, out of 21 total.
1
- 18177470. DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING simplified abstract (QUALCOMM Incorporated)
- 18189859. BUILT-IN SELF-TEST ENHANCEMENTS simplified abstract (QUALCOMM Incorporated)
- 18272432. SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE simplified abstract (Rohm Co., Ltd.)
- 18441926. APPARATUS AND TEST ELEMENT GROUP simplified abstract (Micron Technology, Inc.)
- 18532340. SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18597499. BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA RECOVERY AND SYSTEM-ON-CHIP INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18624070. SINGLE "A" LATCH WITH AN ARRAY OF "B" LATCHES simplified abstract (SambaNova Systems, Inc.)
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- Qualcomm incorporated (20240295601). DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING simplified abstract
- Qualcomm incorporated (20240319268). BUILT-IN SELF-TEST ENHANCEMENTS simplified abstract
- QUALCOMM Incorporated patent applications on September 26th, 2024
- QUALCOMM Incorporated patent applications on September 5th, 2024
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- Samsung electronics co., ltd. (20240210473). SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240302432). BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA RECOVERY AND SYSTEM-ON-CHIP INCLUDING THE SAME simplified abstract
- Samsung Electronics Co., Ltd. patent applications on June 27th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024