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Category:G01N21/55
Subcategories
This category has the following 2 subcategories, out of 2 total.
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T
Pages in category "G01N21/55"
The following 27 pages are in this category, out of 27 total.
1
- 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18107648. INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18317387. SEMICONDUCTOR MEASUREMENT APPARATUS simplified abstract (Samsung Electronics Co., Ltd.)
- 18586543. ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STORAGE DEVICE, AND ELECTRODE PLATE INSPECTION APPARATUS simplified abstract (Prime Planet Energy & Solutions, Inc.)
- 18695923. COAL ANALYZER, COAL ANALYSIS METHOD, MIXED COAL PREPARATION METHOD, AND COKE PRODUCTION METHOD (JFE STEEL CORPORATION)
- 18814695. MULTIPLE LIGHT PATHS ARCHITECTURE AND OBSCURATION METHODS FOR SIGNAL AND PERFUSION INDEX OPTIMIZATION (Apple Inc.)
A
- Apple inc. (20240418644). MULTIPLE LIGHT PATHS ARCHITECTURE AND OBSCURATION METHODS FOR SIGNAL AND PERFUSION INDEX OPTIMIZATION
- Apple Inc. patent applications on December 19th, 2024
- Applied materials, inc. (20240410078). IN-SITU FILM GROWTH RATE MONITORING APPARATUS, SYSTEMS, AND METHODS FOR SUBSTRATE PROCESSING
- Applied Materials, Inc. patent applications on December 12th, 2024
- Applied Materials, Inc. patent applications on January 30th, 2025
B
F
S
- Samsung electronics co., ltd. (20240125709). SEMICONDUCTOR MEASUREMENT APPARATUS simplified abstract
- Samsung electronics co., ltd. (20240272089). DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on August 15th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on August 15th, 2024
- Samsung Electronics Co., Ltd. patent applications on February 6th, 2025
- Seiko epson corporation (20240241051). SPECTROSCOPIC MEASUREMENT METHOD, SPECTROMETER, AND SPECTROSCOPIC MEASUREMENT PROGRAM simplified abstract
- SEIKO EPSON CORPORATION patent applications on July 18th, 2024