There is currently no text in this page. You can search for this page title in other pages, or search the related logs, but you do not have permission to create this page.
Category:CPC G01R31/3177
Pages in category "CPC G01R31/3177"
The following 51 pages are in this category, out of 51 total.
1
- 18089546. SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract (Intel Corporation)
- 18159486. INTEGRATED CIRCUIT INCLUDING CONSTANT-0 FLIP FLOPS RECONFIGURED TO PROVIDE OBSERVABLE AND CONTROLLABLE TEST POINTS simplified abstract (QUALCOMM Incorporated)
- 18350512. DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18538692. DEVICE AND METHOD FOR PROVIDING PHYSICALLY UNCLONABLE FUNCTION WITH HIGH RELIABILITY simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18604021. INTEGRATED CIRCUIT, MEMORY DEVICE INCLUDING THE INTEGRATED CIRCUIT, AND METHOD OF OPERATING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18612251. RESET FOR SCAN MODE EXIT FOR DEVICES WITH POWER-ON RESET GENERATION CIRCUITRY simplified abstract (STMicroelectronics International N.V.)
- 18728225. CIRCUIT CONVERSION METHOD, LATCH CIRCUIT, AND C-ELEMENT CIRCUIT (SONY SEMICONDUCTOR SOLUTIONS CORPORATION)
- 18956830. COMMANDED JTAG TEST ACCESS PORT OPERATIONS (TEXAS INSTRUMENTS INCORPORATED)
- 19005804. AT-SPEED TEST ACCESS PORT OPERATIONS (TEXAS INSTRUMENTS INCORPORATED)
2
A
I
Q
- Qualcomm incorporated (20240248136). INTEGRATED CIRCUIT INCLUDING CONSTANT-0 FLIP FLOPS RECONFIGURED TO PROVIDE OBSERVABLE AND CONTROLLABLE TEST POINTS simplified abstract
- Qualcomm Incorporated Patent Application Trends in 2025
- Qualcomm incorporated Patent Application Trends in 2025
- QUALCOMM Incorporated patent applications on July 25th, 2024
S
- SAMSUNG ELECTRONICS CO., LTD Patent Application Trends in 2024
- Samsung electronics co., ltd. (20240201256). DEVICE AND METHOD FOR PROVIDING PHYSICALLY UNCLONABLE FUNCTION WITH HIGH RELIABILITY simplified abstract
- Samsung electronics co., ltd. (20240310437). INTEGRATED CIRCUIT, MEMORY DEVICE INCLUDING THE INTEGRATED CIRCUIT, AND METHOD OF OPERATING THE SAME simplified abstract
- Samsung Electronics Co., Ltd. Patent Application Trends in 2024
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2024
- Samsung electronics Co., Ltd. Patent Application Trends in 2024
- Samsung electronics CO., LTD. Patent Application Trends in 2025
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2025
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on September 19th, 2024
- Sony Semiconductor Solutions Corporation Patent Application Trends in 2025
- STMicroelectronics International N.V. Patent Application Trends in 2024
- STMicroelectronics International N.V. Patent Application Trends in 2025
T
- Taiwan Semiconductor Manufacturing Co., Ltd Patent Application Trends in 2024
- Taiwan Semiconductor Manufacturing Co., Ltd. Patent Application Trends in 2024
- Taiwan Semiconductor Manufacturing Company Patent Application Trends in 2025
- Taiwan semiconductor manufacturing company, ltd. (20240295603). DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. Patent Application Trends in 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. Patent Application Trends in 2025
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. Patent Application Trends in 2025
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on September 5th, 2024
- Texas instruments incorporated (20250085343). COMMANDED JTAG TEST ACCESS PORT OPERATIONS
- TEXAS INSTRUMENTS INCORPORATED patent applications on March 13th, 2025