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Category:CPC G01N23/223
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Pages in category "CPC G01N23/223"
The following 22 pages are in this category, out of 22 total.
1
- 18460675. APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVICE USING X-RAY DIFFRACTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18611037. ANALYSIS METHOD OF PHOTOSENSITIVE COMPOSITION, PRODUCTION METHOD OF PHOTOSENSITIVE COMPOSITION, AND MANUFACTURING METHOD OF ELECTRONIC DEVICE simplified abstract (FUJIFILM Corporation)
F
- FUJIFILM Business Innovation Corp. Patent Application Trends in 2024
- Fujifilm corporation (20240280518). ANALYSIS METHOD OF PHOTOSENSITIVE COMPOSITION, PRODUCTION METHOD OF PHOTOSENSITIVE COMPOSITION, AND MANUFACTURING METHOD OF ELECTRONIC DEVICE simplified abstract
- FUJIFILM Corporation patent applications on August 22nd, 2024
S
- SAMSUNG ELECTRONICS CO., LTD Patent Application Trends in 2024
- Samsung electronics co., ltd. (20240241067). APPARATUS AND METHOD FOR MEASURING A LAYER OF A SEMICONDUCTOR DEVICE USING X-RAY DIFFRACTION simplified abstract
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2024
- Samsung electronics Co., Ltd. Patent Application Trends in 2024
- Samsung electronics CO., LTD. Patent Application Trends in 2025
- Samsung Electronics Co., Ltd. patent applications on July 18th, 2024
- Saudi Arabian Oil Company Patent Application Trends in 2024
- SAUDI ARABIAN OIL COMPANY Patent Application Trends in 2024
- Schlumberger Technology Corporation patent applications on March 6th, 2025
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD. Patent Application Trends in 2025