Handheld X-ray fluorescence, XRF, analyzer and a method for elemental analysis with a handheld XRF analyzer

Abstract: the present disclosure refers to a handheld x-ray fluorescence, xrf, analyzer (). the xrf analyzer () comprises a radiation source assembly () configured to irradiate a sample () to be tested with an x-ray beam (), a radiation detector assembly () configured to detect a first x-ray fluorescence, xrf, radiation () emitted from the sample () in response to the x-ray beam (), a purge assembly configured for purging through a port connection, a magnet () configured to deflect electrons such that they do not reach the radiation detector assembly () and a processor configured to determine a property of the sample () to be tested from the first x-ray fluorescence, xrf, radiation (). the present disclosure further refers to a method for elemental analysis with a handheld xrf analyzer ().

Inventor(s): Tim Heek, Timo Wolff

CPC Classification: G01N23/223 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms , ))

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