Qualcomm incorporated (20240421105). INKJET PRINTING DEDICATED TEST PINS
INKJET PRINTING DEDICATED TEST PINS
Organization Name
Inventor(s)
Aniket Patil of San Diego CA (US)
Hong Bok We of San Diego CA (US)
Joan Rey Villarba Buot of Escondido CA (US)
INKJET PRINTING DEDICATED TEST PINS
This abstract first appeared for US patent application 20240421105 titled 'INKJET PRINTING DEDICATED TEST PINS
Original Abstract Submitted
in an aspect, an apparatus includes a package. the package includes a substrate, a plurality of components located on a top surface of the substrate, a plurality of ball pads located on a bottom surface of the substrate, a plurality of balls, and a plurality of test pads located on the bottom surface of the substrate. individual balls of the plurality of balls are attached to individual ball pads of the plurality of ball pads.