Micron technology, inc. (20250104779). GANGED READ OPERATION FOR MULTIPLE SUB-BLOCKS
GANGED READ OPERATION FOR MULTIPLE SUB-BLOCKS
Organization Name
Inventor(s)
Yu-Chung Lien of San Jose CA US
Zhenming Zhou of San Jose CA US
GANGED READ OPERATION FOR MULTIPLE SUB-BLOCKS
This abstract first appeared for US patent application 20250104779 titled 'GANGED READ OPERATION FOR MULTIPLE SUB-BLOCKS
Original Abstract Submitted
methods, systems, and devices for a ganged read operation for multiple sub-blocks are described. the method may include writing a respective first logic state to each memory cell of a set of memory portions and biasing a first word line and a second word line to a first voltage. in some examples, the first word line may correspond to a first memory portion and the second word line may correspond to a second memory portion. further, the method may include applying a first read pulse to the first word line and a second read pulse to the second word line and reading a second logic state from one or more memory cells of the first memory portion and the second memory portion. further, the method may include validating the write operation based on reading the second logic state from the memory cells of the first memory portion and the second memory portion.